Khagendra P. Bhandari, Dhurba R. Sapkota, Balaji Ramanujam
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引用次数: 0
Abstract
We described optical properties of zinc oxide (ZnO) nanoparticles determined by spectroscopic ellipsometry analysis from ex situ spectroscopic ellipsometry (ex situ SE) measurements made on nanocrystalline thin films over a spectral range of 0.734 to 4.00 eV. We determined the complex refractive index function, \(\widetilde{n}(\omega )=n(\omega )+i\kappa (\omega )\), by fitting a layered parametric model to the ellipsometric measurements. We collected SE measurements at an incidence angle of 70°. We also determined absorption coefficient spectra using extinction coefficient, κ and wavelength, λ. The direct optical bandgap of the films was obtained as 3.2 eV using the ellipsometric method.
期刊介绍:
MRS Communications is a full-color, high-impact journal focused on rapid publication of completed research with broad appeal to the materials community. MRS Communications offers a rapid but rigorous peer-review process and time to publication. Leveraging its access to the far-reaching technical expertise of MRS members and leading materials researchers from around the world, the journal boasts an experienced and highly respected board of principal editors and reviewers.