Radiation Damage to SiPM Irradiated with Fast Neutrons

IF 0.6 4区 物理与天体物理 Q4 PHYSICS, PARTICLES & FIELDS
N. I. Zamyatin, Yu. A. Kopylov, E. A. Streletskaya, B. L. Topko, A. I. Sheremetyeva
{"title":"Radiation Damage to SiPM Irradiated with Fast Neutrons","authors":"N. I. Zamyatin, Yu. A. Kopylov, E. A. Streletskaya, B. L. Topko, A. I. Sheremetyeva","doi":"10.1134/s1063779624700898","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Silicon pixel photomultipliers (SiPM) are widely used in various fields of scientific experimental equipment. As a rule, the use of SiPM in physical experiments at accelerators assumes the presence of a radiation background in the area where the detection equipment is located. Radiation defects created in the space charge region (SCR) of pixels lead to an increase in thermal generation current, which is a source of noise. The main and practical issues for any experiment are lifetime and degradation rate of the main parameters and SiPM operating modes that reduce the negative effects from the radiation damage accumulation over time. This paper attempts to practically answer some of these questions.</p>","PeriodicalId":729,"journal":{"name":"Physics of Particles and Nuclei","volume":"28 1","pages":""},"PeriodicalIF":0.6000,"publicationDate":"2024-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics of Particles and Nuclei","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1134/s1063779624700898","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, PARTICLES & FIELDS","Score":null,"Total":0}
引用次数: 0

Abstract

Silicon pixel photomultipliers (SiPM) are widely used in various fields of scientific experimental equipment. As a rule, the use of SiPM in physical experiments at accelerators assumes the presence of a radiation background in the area where the detection equipment is located. Radiation defects created in the space charge region (SCR) of pixels lead to an increase in thermal generation current, which is a source of noise. The main and practical issues for any experiment are lifetime and degradation rate of the main parameters and SiPM operating modes that reduce the negative effects from the radiation damage accumulation over time. This paper attempts to practically answer some of these questions.

Abstract Image

用快中子辐照的 SiPM 的辐射损伤
摘要硅像素光电倍增管(SiPM)广泛应用于科学实验设备的各个领域。通常,在加速器物理实验中使用 SiPM 时,检测设备所在区域必须存在辐射背景。在像素的空间电荷区(SCR)中产生的辐射缺陷会导致热发生电流的增加,这是噪声的来源之一。任何实验的主要实际问题是主要参数和 SiPM 工作模式的寿命和衰减率,以减少辐射损伤随时间累积而产生的负面影响。本文试图实际回答其中的一些问题。
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来源期刊
Physics of Particles and Nuclei
Physics of Particles and Nuclei 物理-物理:粒子与场物理
CiteScore
1.00
自引率
0.00%
发文量
116
审稿时长
6-12 weeks
期刊介绍: The journal Fizika Elementarnykh Chastits i Atomnogo Yadr of the Joint Institute for Nuclear Research (JINR, Dubna) was founded by Academician N.N. Bogolyubov in August 1969. The Editors-in-chief of the journal were Academician N.N. Bogolyubov (1970–1992) and Academician A.M. Baldin (1992–2001). Its English translation, Physics of Particles and Nuclei, appears simultaneously with the original Russian-language edition. Published by leading physicists from the JINR member states, as well as by scientists from other countries, review articles in this journal examine problems of elementary particle physics, nuclear physics, condensed matter physics, experimental data processing, accelerators and related instrumentation ecology and radiology.
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