{"title":"Ultra-Low Dark Count Rate SPAD Fully Integrated in a 180 nm High-Voltage CMOS Process","authors":"Borna Požar;Ivan Berdalović;Tihomir Knežević;Tomislav Suligoj","doi":"10.1109/LPT.2024.3457009","DOIUrl":null,"url":null,"abstract":"A novel structure of a single-photon avalanche diode (SPAD) fabricated in a commercial \n<inline-formula> <tex-math>$\\boldsymbol {180}$ </tex-math></inline-formula>\n nm high-voltage (HV) complementary metal-oxide-semiconductor (CMOS) process is presented. Device performance in terms of dark count rate (DCR) and photon detection probability (PDP) is compared to a previously published design fabricated as a reference on the same die. We find that the new structure exhibits a DCR of \n<inline-formula> <tex-math>$\\boldsymbol {0.11}$ </tex-math></inline-formula>\n Hz/\n<inline-formula> <tex-math>$\\boldsymbol {\\mu }$ </tex-math></inline-formula>\nm\n<inline-formula> <tex-math>$\\boldsymbol {^{2}}$ </tex-math></inline-formula>\n at an excess voltage of \n<inline-formula> <tex-math>$\\boldsymbol {5}$ </tex-math></inline-formula>\n V, which is among the lowest ever reported in a foundry CMOS process, and more than \n<inline-formula> <tex-math>$\\boldsymbol {3}$ </tex-math></inline-formula>\n times lower with respect to the reference device. Moreover, the new structure shows a PDP/DCR ratio higher by up to a factor of \n<inline-formula> <tex-math>$\\boldsymbol {4.2}$ </tex-math></inline-formula>\n compared to the reference device. The reasons underlying the differences in DCR and PDP between the two structures are explained using technology computer-aided design (TCAD) simulations. The novel device is demonstrated as promising for the design of low-cost SPAD array imagers, particularly in low-noise applications.","PeriodicalId":13065,"journal":{"name":"IEEE Photonics Technology Letters","volume":"36 20","pages":"1241-1244"},"PeriodicalIF":2.3000,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonics Technology Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10671577/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A novel structure of a single-photon avalanche diode (SPAD) fabricated in a commercial
$\boldsymbol {180}$
nm high-voltage (HV) complementary metal-oxide-semiconductor (CMOS) process is presented. Device performance in terms of dark count rate (DCR) and photon detection probability (PDP) is compared to a previously published design fabricated as a reference on the same die. We find that the new structure exhibits a DCR of
$\boldsymbol {0.11}$
Hz/
$\boldsymbol {\mu }$
m
$\boldsymbol {^{2}}$
at an excess voltage of
$\boldsymbol {5}$
V, which is among the lowest ever reported in a foundry CMOS process, and more than
$\boldsymbol {3}$
times lower with respect to the reference device. Moreover, the new structure shows a PDP/DCR ratio higher by up to a factor of
$\boldsymbol {4.2}$
compared to the reference device. The reasons underlying the differences in DCR and PDP between the two structures are explained using technology computer-aided design (TCAD) simulations. The novel device is demonstrated as promising for the design of low-cost SPAD array imagers, particularly in low-noise applications.
期刊介绍:
IEEE Photonics Technology Letters addresses all aspects of the IEEE Photonics Society Constitutional Field of Interest with emphasis on photonic/lightwave components and applications, laser physics and systems and laser/electro-optics technology. Examples of subject areas for the above areas of concentration are integrated optic and optoelectronic devices, high-power laser arrays (e.g. diode, CO2), free electron lasers, solid, state lasers, laser materials'' interactions and femtosecond laser techniques. The letters journal publishes engineering, applied physics and physics oriented papers. Emphasis is on rapid publication of timely manuscripts. A goal is to provide a focal point of quality engineering-oriented papers in the electro-optics field not found in other rapid-publication journals.