{"title":"An N/PBTI-Isolated BTI Monitor With a Configurable Switching Network and Calibration for Process Variation in Memory Periphery","authors":"Shin-Hyun Jeong;Yong-Un Jeong;Suhwan Kim","doi":"10.1109/TCSII.2024.3442215","DOIUrl":null,"url":null,"abstract":"This brief presents an on-chip bias temperature instability (BTI) monitor to accurately detect performance degradation caused by negative BTI (NBTI) and positive BTI (PBTI) in DRAM periphery. The proposed BTI monitor is capable of isolated measurement of both NBTI and PBTI using a configurable pull-up and pull-down switching network. The dual-delay line topology also ensures fast measurement to minimize unwanted BTI recovery, which reduces measurement accuracy. In addition, a calibration scheme for process variation is proposed using body biasing of devices that mimics BTI-induced stress to further enhance measurement accuracy.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"71 11","pages":"4628-4632"},"PeriodicalIF":4.0000,"publicationDate":"2024-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10634217/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This brief presents an on-chip bias temperature instability (BTI) monitor to accurately detect performance degradation caused by negative BTI (NBTI) and positive BTI (PBTI) in DRAM periphery. The proposed BTI monitor is capable of isolated measurement of both NBTI and PBTI using a configurable pull-up and pull-down switching network. The dual-delay line topology also ensures fast measurement to minimize unwanted BTI recovery, which reduces measurement accuracy. In addition, a calibration scheme for process variation is proposed using body biasing of devices that mimics BTI-induced stress to further enhance measurement accuracy.
期刊介绍:
TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes:
Circuits: Analog, Digital and Mixed Signal Circuits and Systems
Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic
Circuits and Systems, Power Electronics and Systems
Software for Analog-and-Logic Circuits and Systems
Control aspects of Circuits and Systems.