{"title":"Low-Voltage CMOS Capacitor-Less LDOs: Bulk-Driven Versus Gate-Driven Comparative Study","authors":"Óscar Pereira-Rial;Juan M. Carrillo;Paula López","doi":"10.1109/TCSI.2024.3440842","DOIUrl":null,"url":null,"abstract":"This paper explores the feasibility of a capacitor-less (CL) low-dropout (LDO) regulator to operate efficiently in a low-voltage environment. The CL-LDO scheme selected is based on a unity-gain feedback configuration around the error amplifier (EA), so that the inclusion of high-value on-chip resistors is avoided and different key parameters, such as the power supply rejection or the noise, are optimized. A comparative analysis has been carried out over the same LDO structure including a bulk-driven and a gate-driven EA, respectively. The pass branch of the voltage regulator is provided with pseudo-class-AB operation, in order to lead to a very small quiescent current in the standby operation mode, whereas a very large current can be delivered to the load when required. Both regulators were designed and fabricated in 180 nm CMOS technology to operate with a maximum supply voltage of 1.8 V. The extensive experimental characterization showed that the bulk-driven LDO can achieve a significantly lower minimum supply voltage, i.e., 0.6 V, as compared to the gate-driven counterpart, 1 V, under the same reference voltage and load current conditions.","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":null,"pages":null},"PeriodicalIF":5.2000,"publicationDate":"2024-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10638180","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems I: Regular Papers","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10638180/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This paper explores the feasibility of a capacitor-less (CL) low-dropout (LDO) regulator to operate efficiently in a low-voltage environment. The CL-LDO scheme selected is based on a unity-gain feedback configuration around the error amplifier (EA), so that the inclusion of high-value on-chip resistors is avoided and different key parameters, such as the power supply rejection or the noise, are optimized. A comparative analysis has been carried out over the same LDO structure including a bulk-driven and a gate-driven EA, respectively. The pass branch of the voltage regulator is provided with pseudo-class-AB operation, in order to lead to a very small quiescent current in the standby operation mode, whereas a very large current can be delivered to the load when required. Both regulators were designed and fabricated in 180 nm CMOS technology to operate with a maximum supply voltage of 1.8 V. The extensive experimental characterization showed that the bulk-driven LDO can achieve a significantly lower minimum supply voltage, i.e., 0.6 V, as compared to the gate-driven counterpart, 1 V, under the same reference voltage and load current conditions.
期刊介绍:
TCAS I publishes regular papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: - Circuits: Analog, Digital and Mixed Signal Circuits and Systems - Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic - Circuits and Systems, Power Electronics and Systems - Software for Analog-and-Logic Circuits and Systems - Control aspects of Circuits and Systems.