Effect of the GeTe Defect Monolayer on Thermoelectric Properties

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Hao Qin, Ziyu Hu, Xiaohong Shao
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Abstract

Two-dimensional (2D) GeTe is a popular medium-temperature thermoelectric material, but few studies have focused on strategies for improving its thermoelectric performance. To further investigate the thermoelectric properties of two-dimensional GeTe, different atomic defects are introduced, and the electronic structure and thermoelectric properties are systematically investigated via first-principles calculations and the semiclassical Boltzmann theory. Compared with that of three-dimensional (3D) GeTe, the Seebeck coefficient of 2D GeTe increases from 144 μV K−1 to 560 μV K−1 at 700 K, and the thermal conductivity decreases from 3.3 W m−1 K−1 to 2.3 W m−1 K−1. Thus, the ZT value increases from 0.8 to 1.14. On the basis of these results, the influence of vacancy atomic defects on the thermoelectric performance is investigated. With single-atom defects (SV-Ge and SV-Te), the ZT value increases at constant temperature. However, for double-atom defects in monolayer GeTe, the ZT value increases when DV-585 defects are present but decreases to varying degrees when DV-Ge and DV-Te defects are present. The ZT value of monolayer GeTe with DV-585 defects has an average increase of 0.56 at 300–800 K, which accords well with the experimental results. This study indicates that introducing single-atom vacancy defects somewhat improves the thermoelectric performance of monolayer GeTe, which provides an important point of reference for the development of GeTe in the two-dimensional materials field.

Abstract Image

GeTe 缺陷单层对热电特性的影响
二维(2D)GeTe 是一种常用的中温热电材料,但很少有研究关注改善其热电性能的策略。为了进一步研究二维 GeTe 的热电性能,我们引入了不同的原子缺陷,并通过第一性原理计算和半经典玻尔兹曼理论系统地研究了其电子结构和热电性能。与三维 GeTe 相比,二维 GeTe 在 700 K 时的塞贝克系数从 144 μV K-1 增加到 560 μV K-1,热导率从 3.3 W m-1 K-1 降低到 2.3 W m-1 K-1。因此,ZT 值从 0.8 增至 1.14。在这些结果的基础上,研究了空位原子缺陷对热电性能的影响。对于单原子缺陷(SV-Ge 和 SV-Te),ZT 值在恒温条件下会增加。然而,对于单层 GeTe 中的双原子缺陷,当存在 DV-585 缺陷时,ZT 值会增加,但当存在 DV-Ge 和 DV-Te 缺陷时,ZT 值会有不同程度的降低。含有 DV-585 缺陷的单层 GeTe 的 ZT 值在 300-800 K 时平均增加了 0.56,这与实验结果非常吻合。该研究表明,引入单原子空位缺陷在一定程度上改善了单层 GeTe 的热电性能,这为 GeTe 在二维材料领域的发展提供了重要的参考依据。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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