Dynamic Voltage Balancing Across Series-Connected 10 kV SiC JBS Diodes in Medium Voltage 3L-NPC Power Converter Having Snubberless Series-Connected 10 kV SiC MOSFETs
{"title":"Dynamic Voltage Balancing Across Series-Connected 10 kV SiC JBS Diodes in Medium Voltage 3L-NPC Power Converter Having Snubberless Series-Connected 10 kV SiC MOSFETs","authors":"Sanket Parashar;Nithin Kolli;Raj Kumar Kokkonda;Ajit Kanale;Subhashish Bhattacharya;Bantval Jayant Baliga","doi":"10.1109/OJIES.2024.3450509","DOIUrl":null,"url":null,"abstract":"This article addresses the mitigation of dynamic voltage imbalance in series-connected 10 kV silicon carbide (SiC) JBS diodes within a three-level NPC (3L-NPC) converter using active turn-\n<sc>off</small>\n delay control across complementary series-connected 10 kV SiC \n<sc>mosfet</small>\ns. The implementation of active turn-\n<sc>off</small>\n delay control in SiC \n<sc>mosfet</small>\ns eliminates the need for passive \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubbers, which otherwise increase the switching \n<inline-formula><tex-math>$dv/dt$</tex-math></inline-formula>\n mismatch and snubber current across the diodes. In addition, parasitic base-plate capacitance across \n<sc>mosfet</small>\ns and diodes, along with parasitic bus bar and snubber inductance in the commutation path, contribute to turn-\n<sc>off</small>\n voltage mismatch and snubber loss in series-connected 10 kV SiC JBS diodes. The mismatch in nonlinear capacitance of series-connected devices (\n<sc>mosfet</small>\ns and diodes) and the nonlinear \n<sc>mosfet</small>\n \n<inline-formula><tex-math>$i$</tex-math></inline-formula>\n<inline-formula><tex-math>$-$</tex-math></inline-formula>\n<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\n curve affect the turn-\n<sc>on</small>\n and turn-\n<sc>off</small>\n voltage transitions between complementary switching \n<sc>mosfet</small>\ns and diodes, leading to variations in turn-\n<sc>off</small>\n voltage mismatch and snubber losses. The 3L-NPC converter has eight types of switching transition, complicating the analysis of \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubber design. This complexity is further increased by nonlinear device parameters, parasitic capacitance, and inductance in the commutation path for each of the eight 10 kV SiC \n<sc>mosfet</small>\ns and four 10 kV SiC JBS diodes. To address these challenges, this research develops a mathematical model for the switching transition between 10 kV SiC \n<sc>mosfet</small>\ns and complementary 10 kV SiC JBS diodes in a two-level clamped inductive switching (CIS) test setup. The model considers the effects of parasitic base-plate capacitance and the absence of an \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubber due to active turn-\n<sc>off</small>\n delay control across series-connected SiC \n<sc>mosfet</small>\ns. Subsequently, the mathematical model is refined using an iterative algorithm to account for mismatches in nonlinear device capacitance of \n<sc>mosfet</small>\ns and diodes, as well as the nonlinear \n<inline-formula><tex-math>$i$</tex-math></inline-formula>\n<inline-formula><tex-math>$-$</tex-math></inline-formula>\n<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\n curve of \n<sc>mosfet</small>\ns during the switching transition of the diode. This refined model is then used to design the \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubber for series-connected 10 kV SiC JBS diodes and to optimize the turn-\n<sc>on</small>\n gate resistance of complementary 10 kV SiC \n<sc>mosfet</small>\ns on two-level CIS test benches (TB1 and TB2). Following this, the design parameters are systematically adjusted using experimental results from 3L-NPC test benches 3 to 5. This article provides simplified steps for the design and analysis of the \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubber in various test benches, validated by experimental data. The 3L-NPC converter with the final \n<inline-formula><tex-math>$RC$</tex-math></inline-formula>\n snubber design achieved 99.2% efficiency and a 35 V turn-\n<sc>off</small>\n voltage mismatch. The maximum error between the theoretical model and experimental data is 4.8%.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1058-1084"},"PeriodicalIF":5.2000,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10652239","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of the Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10652239/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article addresses the mitigation of dynamic voltage imbalance in series-connected 10 kV silicon carbide (SiC) JBS diodes within a three-level NPC (3L-NPC) converter using active turn-
off
delay control across complementary series-connected 10 kV SiC
mosfet
s. The implementation of active turn-
off
delay control in SiC
mosfet
s eliminates the need for passive
$RC$
snubbers, which otherwise increase the switching
$dv/dt$
mismatch and snubber current across the diodes. In addition, parasitic base-plate capacitance across
mosfet
s and diodes, along with parasitic bus bar and snubber inductance in the commutation path, contribute to turn-
off
voltage mismatch and snubber loss in series-connected 10 kV SiC JBS diodes. The mismatch in nonlinear capacitance of series-connected devices (
mosfet
s and diodes) and the nonlinear
mosfet
$i$$-$$v_{gs}$
curve affect the turn-
on
and turn-
off
voltage transitions between complementary switching
mosfet
s and diodes, leading to variations in turn-
off
voltage mismatch and snubber losses. The 3L-NPC converter has eight types of switching transition, complicating the analysis of
$RC$
snubber design. This complexity is further increased by nonlinear device parameters, parasitic capacitance, and inductance in the commutation path for each of the eight 10 kV SiC
mosfet
s and four 10 kV SiC JBS diodes. To address these challenges, this research develops a mathematical model for the switching transition between 10 kV SiC
mosfet
s and complementary 10 kV SiC JBS diodes in a two-level clamped inductive switching (CIS) test setup. The model considers the effects of parasitic base-plate capacitance and the absence of an
$RC$
snubber due to active turn-
off
delay control across series-connected SiC
mosfet
s. Subsequently, the mathematical model is refined using an iterative algorithm to account for mismatches in nonlinear device capacitance of
mosfet
s and diodes, as well as the nonlinear
$i$$-$$v_{gs}$
curve of
mosfet
s during the switching transition of the diode. This refined model is then used to design the
$RC$
snubber for series-connected 10 kV SiC JBS diodes and to optimize the turn-
on
gate resistance of complementary 10 kV SiC
mosfet
s on two-level CIS test benches (TB1 and TB2). Following this, the design parameters are systematically adjusted using experimental results from 3L-NPC test benches 3 to 5. This article provides simplified steps for the design and analysis of the
$RC$
snubber in various test benches, validated by experimental data. The 3L-NPC converter with the final
$RC$
snubber design achieved 99.2% efficiency and a 35 V turn-
off
voltage mismatch. The maximum error between the theoretical model and experimental data is 4.8%.
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