Xinglong Guo , Qingqing Wu , Yanhang Du , Xinyu Li , Zihao Cui
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引用次数: 0
Abstract
-This article designs and develops a wide-input voltage, high-efficiency, small-size, and peak current-mode control step-down DC-DC converter. The Cadence Spectre simulation tool is used for system simulation to verify the performance of the chip. The overall research content of the article includes the function of the output under heavy load, light load and the stability of the output under transient load changes. The specific content of the research is buck synchronous step-down DC-DC converter chip with pulse modulated. It is provided with an input-voltage range of 6 V–80 V and maximum output-voltage range 72 V. The chip possesses wide operating temperature range of −20 °C to 130 °C. The 92 % high-efficiency can be achieved by using a PWM/PFM hybrid modulation method. When achieving transient load jump, the output voltage change shall not exceed 150 mV. The maximum load current of the chip is 1 A. Furthermore, the chip is packaged and samples can be obtained, and the output light load/heavy load, and other functions are tested through the circuit board. In addition, the chip achieved tape out by using 0.18 μm CMOS process with size of 2027 μm 2020 μm. The converter features current mode control to simplify external compensation and optimize transient response through a wide range of inductors and output capacitors. It can be adopted user-programmable soft-start time to prevent inrush current during startup. It also includes thermal shutdown protection to provide safe and smooth operation in operating conditions.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.