{"title":"An energy-efficient 16 MS/s 10-bit SAR ADC with MSB-block switching scheme","authors":"Mingkang Wan, Yuwei Zhang, Xian Tang","doi":"10.1016/j.mejo.2024.106369","DOIUrl":null,"url":null,"abstract":"<div><p>An energy-efficient MSB-block switching scheme without common-mode voltage variation for successive approximation register (SAR) analog-to-digital converters (ADCs) is proposed. Benefit from a pair of extra switches embedded in the capacitive digital-to-analog converter (CDAC), the proposed MSB-block switching scheme can reduce switching energy without further reducing the capacitor unit. The proposed switching scheme can achieve 93.8 % and 49.9 % savings in switching energy compared with the conventional switching scheme and the Vcm-based switching scheme, and the simulated differential-nonlinearity (DNL) and integrated-nonlinearity (INL) are 0.160 and 0.156LSB, respectively. The proposed switching scheme is verified in a 1.2-V 10-bit 16 MS/s SAR ADC in 65 nm CMOS technology. At maximum sampling rate, the proposed SAR ADC achieves an effective number of bits (ENOB) of 9.50 and a power consumption of <span><math><mrow><mn>103.5</mn><mi>μ</mi><mi>W</mi></mrow></math></span>, leading to a Figure of Merit of 8.93 fJ/Conversion-step.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124000730","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
An energy-efficient MSB-block switching scheme without common-mode voltage variation for successive approximation register (SAR) analog-to-digital converters (ADCs) is proposed. Benefit from a pair of extra switches embedded in the capacitive digital-to-analog converter (CDAC), the proposed MSB-block switching scheme can reduce switching energy without further reducing the capacitor unit. The proposed switching scheme can achieve 93.8 % and 49.9 % savings in switching energy compared with the conventional switching scheme and the Vcm-based switching scheme, and the simulated differential-nonlinearity (DNL) and integrated-nonlinearity (INL) are 0.160 and 0.156LSB, respectively. The proposed switching scheme is verified in a 1.2-V 10-bit 16 MS/s SAR ADC in 65 nm CMOS technology. At maximum sampling rate, the proposed SAR ADC achieves an effective number of bits (ENOB) of 9.50 and a power consumption of , leading to a Figure of Merit of 8.93 fJ/Conversion-step.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.