Nana Zhang;Zhaopeng Yuan;Junhong Yu;Lei Huang;Hongxin Wang;Renpu Li;Yongrui Guo;Yong Ma
{"title":"Estimation Method for Surface and Medium Loss of Fabry-Pérot Etalon","authors":"Nana Zhang;Zhaopeng Yuan;Junhong Yu;Lei Huang;Hongxin Wang;Renpu Li;Yongrui Guo;Yong Ma","doi":"10.1109/LPT.2024.3449345","DOIUrl":null,"url":null,"abstract":"The Fabry-Pérot (FP) etalon is widely applied in experimental research across various fields. In most experiments, the etalon is generally regarded as an ideal optical device. However, if there is any loss in the FP etalon, its parameters including transmittance, linewidth, and finesse will be affected, which will in turn affect the experimental results. In this letter, we propose an estimation method for surface and medium losses of FP etalon. When the FP etalon is not filled with any medium, we establish a relationship between the peak transmittance of the etalon and the surface loss through theoretical calculations. When the FP etalon is filled with a medium, we derive a relationship between the peak transmittance of the etalon and both the surface and the medium loss through calculations. The two functional relationships we established provide a theoretical foundation for experimental measurements of the surface and medium loss of the FP etalon. Based on these functional relationships, we propose a method for estimating the surface and medium losses of FP etalon. Our loss estimation method is also applicable to the FP interferometer.","PeriodicalId":13065,"journal":{"name":"IEEE Photonics Technology Letters","volume":null,"pages":null},"PeriodicalIF":2.3000,"publicationDate":"2024-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonics Technology Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10646394/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The Fabry-Pérot (FP) etalon is widely applied in experimental research across various fields. In most experiments, the etalon is generally regarded as an ideal optical device. However, if there is any loss in the FP etalon, its parameters including transmittance, linewidth, and finesse will be affected, which will in turn affect the experimental results. In this letter, we propose an estimation method for surface and medium losses of FP etalon. When the FP etalon is not filled with any medium, we establish a relationship between the peak transmittance of the etalon and the surface loss through theoretical calculations. When the FP etalon is filled with a medium, we derive a relationship between the peak transmittance of the etalon and both the surface and the medium loss through calculations. The two functional relationships we established provide a theoretical foundation for experimental measurements of the surface and medium loss of the FP etalon. Based on these functional relationships, we propose a method for estimating the surface and medium losses of FP etalon. Our loss estimation method is also applicable to the FP interferometer.
期刊介绍:
IEEE Photonics Technology Letters addresses all aspects of the IEEE Photonics Society Constitutional Field of Interest with emphasis on photonic/lightwave components and applications, laser physics and systems and laser/electro-optics technology. Examples of subject areas for the above areas of concentration are integrated optic and optoelectronic devices, high-power laser arrays (e.g. diode, CO2), free electron lasers, solid, state lasers, laser materials'' interactions and femtosecond laser techniques. The letters journal publishes engineering, applied physics and physics oriented papers. Emphasis is on rapid publication of timely manuscripts. A goal is to provide a focal point of quality engineering-oriented papers in the electro-optics field not found in other rapid-publication journals.