Enhanced plasma grating-induced breakdown spectroscopy for sensitive detection of heavy metal in solution

IF 3.2 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-08-17 DOI:10.1016/j.sab.2024.107019

Fangfang Li , Mengyun Hu , Yu Qiao , Shupeng Xu , Enlai Wan , Heping Zeng

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Abstract

Plasma grating-induced breakdown spectroscopy (GIBS) has gained notable attention for its capacity in trace metal element detection. This study examined the utilization of plasma grating to create micropores and nanoparticles on a Si sample surface and explored their impact on GIBS. We found that the presence of these features resulted in a significant 2.4-fold enhancement in the spectral intensity of the Si plasma at a laser energy of 2.7 mJ, with micropores structures and nanoparticles promoting the plasma excitation. Furthermore, the effect of micropores structures and nanoparticles on the spectral intensities of Cr and Cd elements in water was investigated. Significantly, the spectral line intensity of heavy metal Cr and Cd in the etched area was about 4.5 and 2.6 times that of the unetched area, and the detection limit for trace levels of Cr and Cd in water was determined to be 6.40 mg/L and 75.0 mg/L, respectively. These findings highlight the promising potential of the enhanced GIBS as a more sensitive method for detecting trace metal elements in water.

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用于灵敏检测溶液中重金属的增强型等离子体光栅诱导击穿光谱仪

等离子体光栅诱导击穿光谱（GIBS）因其在痕量金属元素检测方面的能力而备受关注。本研究利用等离子体光栅在硅样品表面形成微孔和纳米颗粒，并探讨它们对 GIBS 的影响。我们发现，在激光能量为 2.7 mJ 时，这些特征的存在使硅等离子体的光谱强度显著增强了 2.4 倍，其中微孔结构和纳米颗粒促进了等离子体的激发。此外，还研究了微孔结构和纳米颗粒对水中铬和镉元素光谱强度的影响。值得注意的是，蚀刻区重金属铬和镉的光谱线强度分别是未蚀刻区的 4.5 倍和 2.6 倍，水中痕量铬和镉的检测限分别为 6.40 毫克/升和 75.0 毫克/升。这些发现凸显了增强型 GIBS 作为一种更灵敏的检测水中痕量金属元素方法的巨大潜力。

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.