Feature area size prediction method of spherical fruit based on projection transformation

Abstract

With the development of machine vision and spectral detection technology, online sorting of fruit internal and external quality has been developed rapidly. However, for spherical fruits, it is difficult to obtain full surface images during sorting, so it is difficult to accurately calculate the size of the surface defects and the ratio of defects to the full surface. In this paper, a full surface line scanning image acquisition device for spherical fruit is proposed. Based on this device, the line scanning hyperspectral image of spherical fruit is collected, and the original image is extracted by feature extraction and background removal. Next, the isometric projection image and the equivalent projection image of the feature image is obtained through cartography projection transformation; The number of feature pixels in the original feature image, the isometric projection image, the equivalent projection image, and the width of the original feature image are used as input parameters to predict the actual defect area with the help of the shallow neural network. In this paper, the equipment and method are verified using three test balls with different diameters and pasting different sizes of identification blocks at different positions on their surfaces. The experimental results show that the prediction accuracy R of the test set of the model is 0.9937, and the RMSE is 0.3391 cm². It can be seen that the method has good prediction accuracy, which can provide a reference for the hyperspectral on-line sorting method of external quality of spherical fruit.

Practical application

This method provides an effective solution for the quality sorting production line of spherical fruits. In addition to agricultural product quality testing and food quality testing, similar to the detection of industrial products such as ball balls, the scheme provided in this manuscript can also be used as one of the options.

The method proposed in this manuscript is suitable for all kinds of line scanning equipment, including hyperspectral imager and laser profilometer.