High-precision measurement of trace-level Nb, Sn, Ta, and W in rutile using electron probe microanalysis

IF 2 4区 地球科学 Q3 GEOSCIENCES, MULTIDISCIPLINARY
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Abstract

The composition of Nb, Sn, Ta, and W in rutile can serve as a highly sensitive indicator for the mineralization of these elements. This information could also be utilized to discriminate different stages of ore deposition or distinct types of deposits. Precise and accurate measurement of trace-level concentrations of these elements in rutile is imperative for such investigations, and can be effectively achieved using electron probe microanalysis (EPMA). In this study, we employed a CAMECA SX5 field emission EPMA to develop an optimal approach for precise and accurate analysis of trace-level Nb, Sn, Ta, and W in rutile. The analytical conditions include an accelerating voltage of 25 kV, a beam current of 200 nA, a beam diameter of 1 μm, optimized background positions for Nb Lα, Sn Lα, Ta Lα, and W Lα, and aggregate intensity counting with a peak counting time of 240 s for each element per spectrometer. The detection limits (3σ) for Nb, Sn, Ta, and W ranged from 22 to 53 ppm. The highest achievable spatial resolution was approximately 4.3 μm. Analytical results obtained from potential rutile standards R10 and R632 were consistent with previous studies within the errors. The precision of these results varied from 1% to 10% (1σ), excluding W in R10 and Nb and Ta in R632, which exceeds the precision achieved in previous EPMA studies. We recommend using R10 as a reference standard for analyses of trace-level Nb, Sn, and Ta, and R632 as an appropriate reference standard for Sn and W when quantifying rutile using EPMA.

利用电子探针显微分析法高精度测量金红石中的痕量 Nb、Sn、Ta 和 W
金红石中 Nb、Sn、Ta 和 W 的成分可以作为这些元素矿化的高度敏感指标。这一信息还可用于区分矿石沉积的不同阶段或不同类型的矿床。精确测量金红石中这些元素的痕量浓度是此类研究的当务之急,而电子探针显微分析(EPMA)可以有效地实现这一目标。在本研究中,我们使用 CAMECA SX5 场发射 EPMA 开发了一种最佳方法,用于精确和准确地分析金红石中痕量水平的 Nb、Sn、Ta 和 W。分析条件包括:25 kV 的加速电压,200 nA 的束流,1 μm 的束流直径,Nb Lα、Sn Lα、Ta Lα 和 W Lα 的优化背景位置,以及每个光谱仪对每种元素进行 240 秒峰值计数的集合强度计数。Nb、Sn、Ta 和 W 的检测限 (3σ) 为 22 至 53 ppm。可达到的最高空间分辨率约为 4.3 μm。从潜在金红石标准 R10 和 R632 中获得的分析结果在误差范围内与之前的研究结果一致。这些结果的精度在 1% 到 10% (1σ) 之间,不包括 R10 中的 W 和 R632 中的 Nb 和 Ta,这超过了以前 EPMA 研究达到的精度。我们建议在使用 EPMA 定量金红石时,将 R10 作为分析痕量 Nb、Sn 和 Ta 的参考标准,将 R632 作为分析 Sn 和 W 的适当参考标准。
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来源期刊
Solid Earth Sciences
Solid Earth Sciences GEOSCIENCES, MULTIDISCIPLINARY-
CiteScore
3.60
自引率
5.00%
发文量
20
审稿时长
103 days
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