Variation-aware automated design and optimization of sub-1V bandgap voltage reference

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Journal Pub Date : 2024-08-22 DOI:10.1016/j.mejo.2024.106373

Abdelrahman A. Mohammad , Mohamed A.Y. Abdalla , Hesham Omran

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引用次数: 0

Abstract

A robust systematic gm/ID-based design procedure for a CMOS low-voltage bandgap reference is introduced. The proposed approach is technology node independent, and it eliminates invoking the simulator in the loop by using precomputed lookup tables (LUTs) generated once. The proposed methodology is capable of addressing the impact of PVT corners and random mismatch. The proposed procedure is verified against Spectre simulations and yields very accurate results. Moreover, the bandgap reference automated synthesis procedure is fully vectorized, enabling the concurrent synthesis of multiple design points in a short time. As a result, large datasets can be generated to span the whole design space, which enables global optimization. Next, local optimization algorithms can be utilized to quickly determine the degrees of freedom of an optimal design point that meets a set of specifications. The speedup of the proposed methodology is around 140x compared to simulation-based optimization in addition to accomplishing better results.

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变异感知自动设计和优化 1V 以下带隙电压基准

针对 CMOS 低压带隙基准，介绍了一种基于 gm/ID 的稳健系统化设计程序。所提出的方法与技术节点无关，通过使用一次生成的预计算查找表 (LUT)，无需在循环中调用模拟器。所提出的方法能够解决 PVT 角和随机失配的影响。所提出的程序经过 Spectre 仿真验证，结果非常准确。此外，带隙参考自动合成程序是完全矢量化的，能够在短时间内同时合成多个设计点。因此，可以生成跨越整个设计空间的大型数据集，从而实现全局优化。接下来，可以利用局部优化算法来快速确定符合一组规格的最佳设计点的自由度。与基于仿真的优化方法相比，所提出方法的速度提高了约 140 倍，而且取得了更好的结果。

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来源期刊

Microelectronics Journal 工程技术-工程：电子与电气

CiteScore

4.00

自引率

27.30%

发文量

222

审稿时长

43 days

期刊介绍： Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.