A Novel Method for Tailoring the Electromagnetic Radiation Emission Limits of Equipment in Complex System

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Yaoyao Li;Youwei Meng;Hao Chen;Houpu Xiao;Shaoxiong Cai
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引用次数: 0

Abstract

The trend toward integration in systems has led to the unpredictability of electromagnetic compatibility within the system. Fixed radiation emission standards struggle to meet the diverse and complex requirements of specific scenarios, making it essential to design or adjust emission limits for specific equipment. To address this issue, this article investigates a method for tailoring the emission limits standard RE102 of radiation equipment in complex systems that include multiple radiating and sensitive equipment. We establish a radiation coupling network model within the system and propose a solution based on the affine-scaling interior-point method for solving the emission limit indicators. This method abstracts the problem of tailoring radiation emission limits into a single-objective optimization problem. We establish a design cost calculation model for each piece of radiation equipment, with the total system design cost as the optimization objective, to obtain the optimal solution under constraints. Finally, through case design and testing involving multiple radiating equipment and sensitive equipment, the test results demonstrate the effectiveness and reliability of the proposed novel method in different scenarios.
定制复杂系统中设备电磁辐射发射限值的新方法
系统集成的趋势导致了系统内电磁兼容性的不可预测性。固定的辐射发射标准难以满足特定场景中多样而复杂的要求,因此必须针对特定设备设计或调整发射限值。为解决这一问题,本文研究了一种方法,用于在包含多种辐射和敏感设备的复杂系统中定制辐射设备的发射限值标准 RE102。我们建立了系统内的辐射耦合网络模型,并提出了一种基于仿射缩放内点法的排放限值指标求解方法。该方法将辐射排放限值的定制问题抽象为单目标优化问题。以系统设计总成本为优化目标,建立各辐射设备的设计成本计算模型,得到约束条件下的最优解。最后,通过涉及多个辐射设备和敏感设备的案例设计和测试,测试结果证明了所提出的新方法在不同场景下的有效性和可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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