Acceptance sampling plans based on percentiles for extended generalized exponential distribution with real data application

Abstract

In this paper, when the life test is truncated at a pre-determined time, new acceptance sampling plans (ASP) are developed based on percentile lifetime as a quality parameter for the extended generalized exponential distribution (EGED). An inspection of a representative sample of goods or materials from a big lot or batch is used in quality control testing under acceptance sampling plans to assess whether the lot satisfies predetermined quality requirements. For the suggested new acceptance sampling plans, the minimum sample sizes needed to emphasize the determined lifetime percentile are obtained for a given customer's risk. The sample plans' operating characteristic function values and the producer's risk are built at various quality levels for some distribution parameters. Some numerical examples are presented to show how the suggested ASP can be used. A genuine industrial data set from a top Korean automobile is fitted to the EGED relative to other competitors and the applicability of the suggested ASP is illustrated. It is found that the suggested ASP for the EGED can be applied by the researchers in production engineering fields.