Soybean seed pest damage detection method based on spatial frequency domain imaging combined with RL-SVM.

Abstract

Soybean seeds are susceptible to damage from the Riptortus pedestris, which is a significant factor affecting the quality of soybean seeds. Currently, manual screening methods for soybean seeds are limited to visual inspection, making it difficult to identify seeds that are phenotypically defect-free but have been punctured by stink bugs on the sub-surface. To facilitate the convenient and efficient identification of healthy soybean seeds, this paper proposes a soybean seed pest detection method based on spatial frequency domain imaging combined with RL-SVM. Firstly, soybean optical data is obtained using single integration sphere technique, and the vigor index of soybean seeds is obtained through germination experiments. Then, based on the above two data items using feature extraction algorithms (the successive projections algorithm and the competitive adaptive reweighted sampling algorithm), the characteristic wavelengths of soybeans are identified. Subsequently, the spatial frequency domain imaging technique is used to obtain the sub-surface images of soybean seeds in a forward manner, and the optical coefficients such as the reduced scattering coefficient ${\mu \text{'}}_s$ and absorption coefficient ${\mu }_a$ of soybean seeds are inverted. Finally, RL-MLR, RL-GRNN, and RL-SVM prediction models are established based on the ratio of the area of insect-damaged sub-surface to the entire seed, soybean varieties, and ${\mu }_a$ at three wavelengths (502 nm, 813 nm, and 712 nm) for predicting and identifying soybean the stinging and sucking pest damage levels of soybean seeds. The experimental results show that the spatial frequency domain imaging technique yields small errors in the optical coefficients of soybean seeds, with errors of less than 15% for ${\mu }_a$ and less than 10% for ${\mu \text{'}}_s$ . After parameter adjustment through reinforcement learning, the Macro-Recall metrics of each model have improved by 10%-15%, and the RL-SVM model achieves a high Macro-Recall value of 0.9635 for classifying the pest damage levels of soybean seeds.