A demultiplexer-based dual-path switching true random number generator

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Journal Pub Date : 2024-08-06 DOI:10.1016/j.mejo.2024.106363

Tianming Ni , Kejie Xu , Hao Wu , Senling Wang , Mu Nie

引用次数: 0

Abstract

This paper presents a demultiplexer (DEMUX) based dual-path switching true random number generator (TRNG). Unlike the classical single chain TRNG, the proposed TRNG utilizes DEMUXs to separate the cumulative jitter and occurrence of metastability in two paths. It also uses Ring Oscillator (RO) to increase the uncertainty of path switching time. Therefore, two sources of entropy are skilfully combined and no post-processing circuitry is required. The proposed structure is implemented on Xilinx Virtex-7 FPGA development board. The experimental results show that the proposed structure is able to achieve a high throughput of 500 Mbps with 33 Look-up Tables (LUTs) and 4 Flip-Flops (FFs). This effectively improves the throughput with high quality entropy and low hardware overhead.

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基于解复用器的双路径切换真随机数发生器

本文提出了一种基于解复用器（DEMUX）的双路径切换真随机数发生器（TRNG）。与经典的单链 TRNG 不同，本文提出的 TRNG 利用 DEMUX 分离两条路径中的累积抖动和发生的不稳定性。它还使用环形振荡器（RO）来增加路径切换时间的不确定性。因此，两个熵源巧妙地结合在一起，无需后处理电路。所提出的结构是在 Xilinx Virtex-7 FPGA 开发板上实现的。实验结果表明，所提出的结构能够利用 33 个查找表（LUT）和 4 个触发器（FF）实现 500 Mbps 的高吞吐量。这有效地提高了吞吐量，同时实现了高质量熵和低硬件开销。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microelectronics Journal 工程技术-工程：电子与电气

CiteScore

4.00

自引率

27.30%

发文量

222

审稿时长

43 days

期刊介绍： Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.