High-throughput true random number generator based on a dual-input oscillation circuit

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Journal Pub Date : 2024-08-11 DOI:10.1016/j.mejo.2024.106367

引用次数: 0

Abstract

The rapid development in the fields of information encryption, key generation, and algorithm initialization requires an increasing rate of true random numbers, making it necessary to design a fast true random number generator. In this work, a dual-mode conversion high throughput true random number generator (TRNG) based on a dual input oscillating XOR circuit (DIO-XOR) is proposed, which is designed using DIO-XOR, combined with a MUX selects the feedback mode of the whole circuit: self-feedback/mutual feedback. It is verified by automatic layout and routing on Xilinx Artix-7 and Kintex-7 FPGAs with a throughput rate of 650Mbps, which is achieved with low hardware overhead, and passes the entropy estimation test suite, NIST SP800-90B, as well as TESTU01 with high entropy, the sequences generated in the temperature-voltage fluctuation test pass the NIST SP800-22 test with good robustness.

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基于双输入振荡电路的高吞吐量真随机数发生器

随着信息加密、密钥生成和算法初始化领域的快速发展，对真随机数的要求越来越高，因此有必要设计一种快速的真随机数发生器。本文提出了一种基于双输入振荡 XOR 电路（DIO-XOR）的双模转换高吞吐量真随机数发生器（TRNG），它采用 DIO-XOR 设计，结合 MUX 选择整个电路的反馈模式：自反馈/互反馈。通过在 Xilinx Artix-7 和 Kintex-7 FPGA 上的自动布局和路由验证，以较低的硬件开销实现了 650Mbps 的吞吐率，并以高熵通过了熵估计测试套件 NIST SP800-90B，以及 TESTU01，在温度-电压波动测试中生成的序列以良好的鲁棒性通过了 NIST SP800-22 测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microelectronics Journal 工程技术-工程：电子与电气

CiteScore

4.00

自引率

27.30%

发文量

222

审稿时长

43 days

期刊介绍： Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.