An all-digital low-complexity blind background calibration of timing mismatch in time-interleaved ADCs

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Wei Zhong , Lili Lang , Yemin Dong
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引用次数: 0

Abstract

This paper proposed a novel all-digital blind background calibration to mitigate timing mismatch in time-interleaved analog-to-digital converter (TIADC). In estimation module, the adoption of a subtraction-based error extraction function and the design of Variable-Step-Size Least Mean Squares algorithm contribute to reducing the computational complexity and enhancing the convergence speed with optimal output accuracy respectively. In compensation module, a dual-stage Taylor series expansion structure has been introduced to effectively maintain the overall output performance. The proposed architecture is applied to a 12-bit 3 GS/s four-channel TIADC model. Its effectiveness for single-tone and multi-tone signals is proven through systematical testing and analysis. The simulation results exhibit that the Spurious Free Dynamic Range is significantly improved by 54.53 dB in the single-tone signal case, and the timing mismatch is converged after 1000 samples. The proposed calibration circuit has been synthesized utilizing a 28 nm standard cell library for assessing its hardware consumption, area (0.051 mm2) and average power dissipation (67.5 mW) within the integrated chip architecture. Our technology provides a viable optimization solution to improve efficiency of TIADC in high-speed systems.

时间交错 ADC 时序失配的全数字低复杂度盲背景校准
本文提出了一种新颖的全数字盲背景校准方法,以缓解时间交错模数转换器(TIADC)中的时序失配问题。在估计模块中,采用了基于减法的误差提取函数,并设计了可变步长最小均方算法,分别有助于降低计算复杂度和提高收敛速度,并获得最佳输出精度。在补偿模块中,引入了双级泰勒级数扩展结构,以有效保持整体输出性能。所提出的结构被应用于一个 12 位 3 GS/s 四通道 TIADC 模型。通过系统测试和分析,证明了它对单音和多音信号的有效性。仿真结果表明,在单音信号情况下,无杂散动态范围显著提高了 54.53 dB,1000 个采样后,时序不匹配现象趋于稳定。我们利用 28 纳米标准单元库合成了所提出的校准电路,以评估其在集成芯片架构内的硬件消耗、面积(0.051 平方毫米)和平均功耗(67.5 毫瓦)。我们的技术为提高高速系统中 TIADC 的效率提供了可行的优化解决方案。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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