{"title":"DLB-CNet: Difference Learning-Based Convolution Network for Building Change Detection","authors":"Zipeng Fan;Sanqian Wang;Xueting Pu;Yuting Cong;Yuan Liu;Xiubao Sui;Qian Chen","doi":"10.1109/TVLSI.2024.3438728","DOIUrl":null,"url":null,"abstract":"Change detection (CD) in remote sensing (RS) images is a technique used to analyze and characterize surface changes from remotely sensed data at different time periods. However, current deep-learning-based methods sometimes struggle with the diversity of targets in complex RS scenarios, leading to issues, such as false detections and loss of detail. To address these challenges, we propose a method called difference learning-based convolution and network (DLB-CNet) for building CD (BCD). In DLB-CNet, we use difference learning module (DLM), accomplishing the extraction of building change features by enhancing the feature differences between the two images and enhancing model robustness. Additionally, an innovative attention module called integration attention (IA) is introduced to efficiently process semantic information by jointly focusing on global representation subspaces. Our model achieves impressive results on the LEVIR-CD dataset, WHU-CD dataset, and CDD dataset, with \n<inline-formula> <tex-math>${F}1$ </tex-math></inline-formula>\n-scores of 90.56%, 92.28%, and 94.98%, respectively, demonstrating its superiority over the state-of-the-art methods.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10633275/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Change detection (CD) in remote sensing (RS) images is a technique used to analyze and characterize surface changes from remotely sensed data at different time periods. However, current deep-learning-based methods sometimes struggle with the diversity of targets in complex RS scenarios, leading to issues, such as false detections and loss of detail. To address these challenges, we propose a method called difference learning-based convolution and network (DLB-CNet) for building CD (BCD). In DLB-CNet, we use difference learning module (DLM), accomplishing the extraction of building change features by enhancing the feature differences between the two images and enhancing model robustness. Additionally, an innovative attention module called integration attention (IA) is introduced to efficiently process semantic information by jointly focusing on global representation subspaces. Our model achieves impressive results on the LEVIR-CD dataset, WHU-CD dataset, and CDD dataset, with
${F}1$
-scores of 90.56%, 92.28%, and 94.98%, respectively, demonstrating its superiority over the state-of-the-art methods.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.