Feasibility of Gallium Nitride for Astronomical Charge-Coupled Devices

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Anmol Aggarwal, George M. Seabroke, Nitin K. Puri
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Abstract

All astronomical missions use charge-coupled devices (CCDs) as vital organs. Usually, silicon (Si) is preferred to build them, which does not perform well without enhancements such as anti-reflection (AR) coatings. Such devices exhibit poor performance in the large (> 800 nm) and small (< 500 nm) wavelength ranges, even with AR coatings. We present studies that signify gallium nitride (GaN) as a potential replacement for Si in astronomical CCDs that operate in a wide wavelength range. For this purpose, SILVACO TCAD software has been used for simulating and comparing the electronic and optical properties of a GaN CCD pixel with a Gaia astrometric field (AF) CCD pixel. Our observations demonstrate that the electronic and optical performance of the GaN-based CCD pixel is significantly better than the Si-based AF CCD pixel. These findings can prove to be the bedrock of future astronomical exploration and broadband astronomical CCDs, as the simulated GaN CCD pixel exhibits a high quantum efficiency even without any reinforcements.

Abstract Image

氮化镓用于天文电荷耦合器件的可行性
所有天文任务都使用电荷耦合器件(CCD)作为重要器官。通常使用硅(Si)来制造这些器件,但如果不使用抗反射(AR)涂层等增强技术,硅(Si)的性能并不理想。此类器件在大(800 nm)和小(500 nm)波长范围内表现不佳,即使使用 AR 涂层也是如此。我们所做的研究表明,氮化镓(GaN)有可能替代硅,用于在宽波长范围内工作的天文 CCD。为此,我们使用了 SILVACO TCAD 软件来模拟和比较氮化镓 CCD 像素与盖亚天体测量场 (AF) CCD 像素的电子和光学特性。我们的观测结果表明,氮化镓基 CCD 像素的电子和光学性能明显优于硅基 AF CCD 像素。这些发现可被证明是未来天文探索和宽带天文 CCD 的基石,因为模拟的氮化镓 CCD 像素即使在没有任何强化的情况下也能表现出很高的量子效率。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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