Tuning sensitivity of surface plasmon resonance sensor based on ZnO layer and CaF2 prism for the recognition of SARS-CoV-2

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Amrindra Pal, Youssef Trabelsi, Partha Sarkar, Manoj Sharma, Manoj Kumar, Arun Uniyal
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Abstract

In this work, a Zinc Oxide (ZnO) and Silver (A+) layer with 2D material of graphene layer on a CaF2 prism is introduced as part of an ultra-high sensitive SPR sensor intended for a modified Kretschmann configuration for the detection of coronavirus SARS-CoV-2 that use angular interrogation. The configuration is highlighted for its substantial contribution to sensitivity enhancement, especially when combined with the low refractive index CaF2 prism. ZnO is a metal oxide that is particularly interesting because of its unique optical and physical properties. The study optimizes the number (no.) of graphene layers and the thickness of the Ag layer using the transfer matrix method (TMM) to achieve a reflectance curve, a reasonable full width at half maximum (FWHM), and increased sensitivity. A well-optimized structure can produce remarkable results, as noted by numerical results showing a sensitivity of up to 364.17◦/RIU with remarkable figure of merit (FoM). Based on its outstanding performance in future scope, the proposed sensor is suitable for sensing applications in the industrial and biomedical fields.

Abstract Image

基于氧化锌层和 CaF2 棱镜的表面等离子体共振传感器在识别 SARS-CoV-2 时的灵敏度调节
本研究在 CaF2 棱镜上引入了带有二维材料石墨烯层的氧化锌(ZnO)和银(A+)层,作为超高灵敏度 SPR 传感器的一部分,该传感器采用改良的 Kretschmann 配置,利用角度询问法检测冠状病毒 SARS-CoV-2。该配置因其对灵敏度提升的巨大贡献而备受瞩目,尤其是与低折射率 CaF2 棱镜结合使用时。氧化锌是一种金属氧化物,因其独特的光学和物理特性而特别引人关注。该研究利用转移矩阵法(TMM)优化了石墨烯层的数量和银层的厚度,以实现反射率曲线、合理的半最大全宽(FWHM)和更高的灵敏度。正如数值结果所显示的那样,经过优化的结构可以产生显著的效果,其灵敏度高达 364.17◦/RIU,并具有出色的优越性(FoM)。基于其在未来范围内的出色性能,所提出的传感器适用于工业和生物医学领域的传感应用。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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