Arish Sateesan, J. Vliegen, Simon Scherrer, H. Hsiao, A. Perrig, N. Mentens
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引用次数: 0
Abstract
Network flow measurement is an integral part of modern high-speed applications for network security and data-stream processing. However, processing at line rate while maintaining the required data structure within the on-chip memory of the hardware platform is a challenging task for measurement algorithms, especially when accuracy is of primary importance, such as in network security applications. Most of the existing measurement algorithms are no exception to such issues when deployed in high-speed networking environments and are also not tailored for efficient hardware implementation. Sketch-based measurement algorithms minimize the memory requirement and are suitable for high-speed networks but possess a low memory-accuracy trade-off and lack the versatility of individual flow mapping. To address these challenges, we present a hardware-friendly data structure named Sketch-based Pseudo-associative array Architecture (SPArch). SPArch is highly accurate and extremely memory-efficient, making it suitable for network flow measurement and security applications. The parallelism in SPArch ensures minimal and constant memory access cycles. Unlike other sketch architectures, SPArch provides the functionality of individual flow mapping similar to associative arrays, and the optimized version of SPArch allows the organization of counters in multiple buckets based on the flow sizes. An in-depth analysis of SPArch is carried out in this paper and implemented SPArch on the Alveo data center accelerator card, demonstrating its suitability for high-speed networks.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico