X‐ray spectroscopy and quantification of an AlCuLi quasi‐crystal: A step forward for combination of reflection zone plate and crystal spectrometers

IF 1.5 4区物理与天体物理 Q3 SPECTROSCOPY

X-Ray Spectrometry Pub Date : 2024-08-08 DOI:10.1002/xrs.3447

K. Hassebi, N. Rividi, Omar Boudouma, Michel Fialin, K. Le Guen, Philippe Jonnard

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Abstract

We present the analysis of an AlCuLi quasi‐crystal on an electron probe microanalyser equipped with spectrometers working both in the soft and ultra‐soft x‐ray ranges. This original combination enables obtaining the Li Kα and Al L2,3 emissions with a reflection plate spectrometer and the Al Kβ and Cu Lα emissions with a curved‐crystal spectrometer. All these emissions are emission bands, sensitive to the chemical state of the emitting element. From the observation of the valence band shapes, it is confirmed that the electronic structure of the quasi‐crystal is quite different from that of the corresponding pure metals. From the measured intensities, quantification is performed using the PAP model. The weight fractions calculated from the ultra‐soft x‐ray emission intensities are very dependent on the chosen database of mass attenuation coefficients. Comparison with fractions calculated with small uncertainty in the soft x‐ray range enables choosing which databases are the most relevant for the ultra‐soft x‐ray range. Both quantifications performed from ultra‐soft and soft x‐ray emissions are compatible, leading to the Al60Cu24Li16 weight concentration of the quasi‐crystal.

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AlCuLi 准晶体的 X 射线光谱和定量分析：反射区板和晶体光谱仪的结合向前迈进了一步

我们在电子探针显微分析仪上对铝铜锂准晶体进行了分析，该仪器配备了可在软X射线和超软X射线范围内工作的光谱仪。这种新颖的组合可以通过反射板光谱仪获得锂 Kα 和铝 L2,3 发射，通过曲晶光谱仪获得铝 Kβ 和铜 Lα 发射。所有这些发射都是发射带，对发射元素的化学状态非常敏感。通过对价带形状的观察，可以确认准晶体的电子结构与相应纯金属的电子结构大不相同。根据测量到的强度，使用 PAP 模型进行了量化。根据超软 X 射线发射强度计算出的重量分数与所选的质量衰减系数数据库有很大关系。与在软 X 射线范围内计算出的不确定性较小的分数进行比较，可以选择与超软 X 射线范围最相关的数据库。根据超软 X 射线和软 X 射线辐射进行的两种定量分析是兼容的，从而得出准晶体的 Al60Cu24Li16 重量浓度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

X-Ray Spectrometry 物理-光谱学

CiteScore

3.10

自引率

8.30%

发文量

审稿时长

6-12 weeks

期刊介绍： X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources. Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods. Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.