A Simple and Effective Planar Near-Field Measurement Method With Sparse Nonuniform Sampling

IF 3.7 2区计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Antennas and Wireless Propagation Letters Pub Date : 2024-08-02 DOI:10.1109/LAWP.2024.3437431

Yinglong Chen;Xiaobo Liu;Junhao Zheng;Xiaoming Chen

引用次数: 0

Abstract

This letter presents a sparse nonuniform sampling method for a planar near-field measurement system. First, the Igloo spherical sampling points are mapped into the near-field planar sampling points, which determine the positions and quantity of nonuniform sampling points. Then, the sparse nonuniform sampling points can accurately recover the near-field distribution through linear interpolation. Finally, the fast Fourier transform-based near-to-far-field transformation is applied to derive the far-field radiation pattern of the antenna under the test. Simulations and measurements demonstrate that the near-field and far-field results agree well with those obtained through the existing half-wavelength uniform sampling method. Thus, the presented method can significantly reduce the sampling points without sacrificing the measurement accuracy.

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采用稀疏非均匀采样的简单有效平面近场测量方法

本文提出了一种平面近场测量系统的稀疏非均匀采样方法。首先，将Igloo球形采样点映射为近场平面采样点，确定非均匀采样点的位置和数量；然后，稀疏的非均匀采样点可以通过线性插值准确地恢复近场分布。最后，采用基于快速傅立叶变换的近场到远场变换，推导出被测天线的远场辐射方向图。仿真和测量结果表明，近场和远场结果与现有半波长均匀采样方法的结果吻合较好。因此，该方法可以在不牺牲测量精度的情况下显著减少采样点。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Antennas and Wireless Propagation Letters 工程技术-电信学

CiteScore

8.00

自引率

9.50%

发文量

529

审稿时长

1.0 months

期刊介绍： IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.