17-Cell battery monitoring analog front end with high sampling accuracy for battery pack applications

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
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引用次数: 0

Abstract

Battery management system (BMS) is a critical aspect to ensure the safe, reliable operation of lithium ion batteries for battery pack applications. Although some battery pack monitoring schemes have increased the number of measurable channels in a chip for higher voltage battery packs, the issue of accuracy caused by the common mode voltage difference in each unit of series battery pack remains unsolved. A high voltage multiplexer of 17-cell battery monitoring analog front end (AFE) is adopted to acquire each cell voltage for accurate monitoring. Besides, a current compensation scheme is proposed to tackle the current leakage in each channel to further improve the acquisition accuracy. The proposed scheme is implemented in 0.18 μm high-voltage BCD process, and occupies a die size of 2.92 × 3.23 mm2. The experimental results reveal that the sensing error of 17 battery cells is within ±2 mV under the input cell voltage from 1 to 5V.

17 芯电池监测模拟前端,采样精度高,适用于电池组应用
电池管理系统(BMS)是确保电池组应用中锂离子电池安全可靠运行的关键环节。虽然一些电池组监测方案增加了芯片中可测量通道的数量,以适用于更高电压的电池组,但串联电池组中每个单元的共模电压差导致的精度问题仍未得到解决。采用 17 节电池监测模拟前端 (AFE) 的高压多路复用器来获取每节电池的电压,从而实现精确监测。此外,还提出了一种电流补偿方案,以解决每个通道的电流泄漏问题,从而进一步提高采集精度。该方案采用 0.18 μm 高压 BCD 工艺实现,芯片尺寸为 2.92 × 3.23 mm2。实验结果表明,在 1 至 5V 的输入电池电压下,17 个电池单元的感应误差在 ±2 mV 范围内。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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