Impact of Immersion Cooling On Thermomechanical Properties of Halogen-free Substrate Core

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
P. Bansode, Rohit Suthar, Rabin Bhandari, A. Lakshminarayana, Naga Tejesh Ede, Gautam Gupta, V. Simon, Himanshu Modi, Vivek Nair, Pardeep Shahi, S. Saini, Krishna Bhavana Sivaraju, D. Agonafer
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引用次数: 0

Abstract

The data center's server power density and heat generation have increased exponentially because of the recent, unparalleled rise in the processing and storing of massive amounts of data on a regular basis. One-third of the overall energy used in conventional air-cooled data centers is directed toward cooling information technology equipment (ITE). The traditional air-cooled data centers must have low air supply temperatures and high air flow rates to support high-performance servers, rendering air cooling inefficient and compelling data center operators to use alternative cooling technology. Due to the direct interaction of dielectric fluids with all the components in the server, single-phase liquid immersion cooling (Sp-LIC) addresses mentioned problems by offering a significantly greater thermal mass and a high percentage of heat dissipation. Sp-LIC is a viable option for hyper-scale, edge, and modular data center applications because, unlike direct-to-chip liquid cooling, it does not call for a complex liquid distribution system configuration and the dielectric liquid can make direct contact with all server components. Immersion cooling is superior to conventional air-cooling technology in terms of thermal energy management however, there have been very few studies on the reliability of such cooling technology. A detailed assessment of the material compatibility of different electronic packaging materials for immersion cooling was required to comprehend their failure modes and reliability. For the mechanical design of electronics, the modulus, and glass transition temperature (Tg) are essential material characteristics. The substrate is a crucial element of an electronic package that has a significant impact on the reliability and failure mechanisms of electronics at both the package and the board level. As per Open Compute Project (OCP) design guidelines for immersion-cooled IT equipment, the traditional material compatibility tests from standards like ASTM 3455 can be used with certain appropriate adjustments. The primary focus of this research is to address two challenges: The first part is to understand the impact of thermal aging on the thermo-mechanical properties of the halogen-free substrate core in the single-phase immersion cooling. Another goal of the study is to comprehend how thermal aging affects the thermo-mechanical characteristics of the substrate core in the air. In this research the substrate core is aged in synthetic hydrocarbon fluid (EC110), Polyalphaolefin 6 (PAO 6), and ambient air for 720 hours each at two different temperatures: 85°C and 125°C and the complex modulus and the glass transition temperature before and after aging are calculated and compared.
浸入冷却对无卤基底芯材热机械特性的影响
由于近期海量数据的处理和存储量空前增加,数据中心服务器的功率密度和发热量也成倍增加。传统风冷数据中心总能耗的三分之一用于冷却信息技术设备(ITE)。传统的风冷式数据中心必须具有较低的供气温度和较高的空气流速,才能支持高性能服务器,这就导致风冷效率低下,迫使数据中心运营商使用其他冷却技术。由于介质流体与服务器中的所有组件直接相互作用,单相液体浸入式冷却(Sp-LIC)可提供更大的热质量和更高的散热比例,从而解决上述问题。Sp-LIC 是超大规模、边缘和模块化数据中心应用的可行选择,因为与直接到芯片的液体冷却不同,它不需要复杂的液体分配系统配置,介质液体可以与所有服务器组件直接接触。就热能管理而言,浸入式冷却优于传统的空气冷却技术,但有关这种冷却技术可靠性的研究却很少。需要对用于浸入式冷却的不同电子封装材料的材料兼容性进行详细评估,以了解其故障模式和可靠性。对于电子产品的机械设计而言,模量和玻璃化转变温度(Tg)是材料的基本特性。基材是电子封装的关键要素,对电子封装和电路板层面的可靠性和失效机制有重大影响。根据开放计算项目(OCP)针对浸入式冷却 IT 设备的设计指南,可以使用 ASTM 3455 等标准中的传统材料兼容性测试,但需要进行某些适当的调整。本研究的主要重点是解决两个难题:第一部分是了解单相浸入式冷却中热老化对无卤基板内核热机械性能的影响。研究的另一个目标是理解热老化如何影响空气中衬底磁芯的热机械特性。在这项研究中,基底芯材在合成碳氢化合物流体(EC110)、聚α烯烃 6(PAO 6)和环境空气中分别在两种不同温度下老化 720 小时:计算并比较了老化前后的复合模量和玻璃化转变温度。
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来源期刊
Journal of Electronic Packaging
Journal of Electronic Packaging 工程技术-工程:电子与电气
CiteScore
4.90
自引率
6.20%
发文量
44
审稿时长
3 months
期刊介绍: The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems. Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.
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