Analysis of earthquake-prone areas based on the seismic wave velocity, young's modulus, shear modulus, and Poisson’s ratio for disaster risk reduction in Bengkulu city, Indonesia
IF 4.3 3区 材料科学Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Arif Ismul Hadi, Sunaryo, M. Farid, Refrizon, Budi Harlianto, Darmawan Ikhlas Fadli, Eli Putriani
{"title":"Analysis of earthquake-prone areas based on the seismic wave velocity, young's modulus, shear modulus, and Poisson’s ratio for disaster risk reduction in Bengkulu city, Indonesia","authors":"Arif Ismul Hadi, Sunaryo, M. Farid, Refrizon, Budi Harlianto, Darmawan Ikhlas Fadli, Eli Putriani","doi":"10.1007/s11069-024-06827-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"52 20","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2024-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1007/s11069-024-06827-3","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico