Counteracting sawtooth crash effects via fluctuation-induced inward transport in HL-2A NBI plasma

IF 4.3 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

ACS Applied Electronic Materials Pub Date : 2024-07-26 DOI:10.1088/1741-4326/ad67f2

Jie Wu, Tao Lan, Weixing Ding, Jiaren Wu, Min Xu, Lin Nie, Wei Chen, Min Jiang, Zhihui Huang, K. Yi, Na Wu, Weice Wang, Q. Zou, T. Long, B. Yuan, Liming Yu, Yi Yu, R. Ke, Hangqi Xu, Pengcheng Lu, Tianxiong Wang, Qi Dong, Yongkang Zhou, Hu Cai, Peng Deng, Xingkang Wang, Zeqi Bai, Yuhua Huang, Chen Chen, W. Mao, Chu Zhou, Ah Di Liu, Zhengwei Wu, Jinlin Xie, Wulyu Zhong, Xuru Duan, Wandong Liu, Zhuang Ge

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引用次数: 0

Abstract

The Langmuir probe observed an increase in density and floating potential fluctuations after the sawtooth crash at the edge of HL-2A neutral beam injection heated plasma. This process initiates fluctuating-induced radial inward particle transport once the plasma enters a period with strong sawtooth crash. The inward transport comprises broad-band fluctuations with varying scales, which occur uniquely in the immediate aftermath of the sawtooth crash-driven outflow, signifying a transient phenomenon confined to that specific interval. These results demonstrate that the sawtooth crash can significantly impact edge turbulence by modifying electrostatic fluctuations. This modification changes the direction of electric fluctuation-induced particle transport, thereby reducing the influence of the intense sawtooth crash-driven outflow. Furthermore, the observations support the existence of a damping mechanism for the outflow during the formation of inward flux after the sawtooth crash, which may be associated with the recovery process of sawtooth cycle.

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通过 HL-2A NBI 血浆中波动诱导的内向转运抵消锯齿碰撞效应

朗缪尔探针在 HL-2A 中性束注入加热等离子体边缘的锯齿碰撞后观察到密度和浮动电势波动的增加。一旦等离子体进入强锯齿碰撞期，这一过程就会启动波动诱导的粒子径向内向输运。内向输运包括不同尺度的宽带波动，这种波动独特地发生在锯齿碰撞驱动的流出之后，表明这是一种仅限于特定时间段的瞬态现象。这些结果表明，锯齿撞击可以通过改变静电波动对边缘湍流产生重大影响。这种改变改变了电波动引起的粒子传输方向，从而减少了锯齿撞击驱动的强烈外流的影响。此外，观测结果支持在锯齿撞击后形成内向通量期间存在外流阻尼机制，这可能与锯齿循环的恢复过程有关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567

期刊介绍： ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/Abstracted： Web of Science SCIE Scopus CAS INSPEC Portico