Elevated thermal stability of the dielectric properties of CaMoO4–TiO2 composites under temperature variations

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Francisco Enilton Alves Nogueira, João Paulo Costa do Nascimento, Tallison Oliveira Abreu, Roterdan Fernandes Abreu, Anupama Ghosh, Felipe Felix do Carmo, Marcelo Antonio Santos da Silva, Ronaldo Santos da Silva, S. V. Trukhanov, Di Zhou, C. Singh, Antonio Sergio Bezerra Sombra
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Abstract

In this article, the dielectric properties of the ceramic CaMoO4 (CMO) with additions of 0, 8, 12, and 20% by mass (wt %) of TiO2 in the radiofrequency (RF) region were studied. X-ray diffraction analysis showed that no secondary phases formed after the addition of TiO2. Scanning electron microscopy was used to analyse the effects on the morphology of the CMO. Complex Impedance Spectroscopy (CIS) was performed to evaluate the electrical properties of the materials, while temperature coefficient of capacitance (TCC) analysis showed that at 10 kHz, CMO12 (CMO with 12 wt % TiO2) presented a TCC equal to zero, demonstrating that this material is thermally stable at this frequency. The activation energy (Ea) was calculated by AC conductivity and imaginary part of the electric modulus (M″) at different temperatures. The Ea values were close, indicating that the thermally activated conduction process is the same. Moreover, the addition of TiO2 resulted in a decrease in the Ea, implying an increased conductivity of the material. The results obtained show that the materials evaluated would be interesting candidates for application in electronic circuits that operate in the radiofrequency region.

Abstract Image

温度变化下 CaMoO4-TiO2 复合材料介电性能热稳定性的提高
本文研究了添加 0、8、12 和 20% 质量分数(重量百分比)TiO2 的陶瓷 CaMoO4(CMO)在射频(RF)区域的介电性能。X 射线衍射分析表明,添加 TiO2 后没有形成次生相。扫描电子显微镜用于分析对 CMO 形态的影响。复阻抗光谱(CIS)用于评估材料的电学特性,而电容温度系数(TCC)分析表明,在 10 kHz 频率下,CMO12(含有 12 wt % TiO2 的 CMO)的 TCC 等于零,表明这种材料在此频率下具有热稳定性。活化能(Ea)是通过不同温度下的交流电导率和电模量的虚部(M″)计算得出的。Ea 值非常接近,表明热激活传导过程是相同的。此外,添加二氧化钛会导致 Ea 值下降,这意味着材料的导电性增强。研究结果表明,所评估的材料有望应用于在射频区域工作的电子电路中。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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