M. Dhanalakshmi, C. Balakrishnan, M. Vijayasri, G. Vinitha, S. Parthiban
{"title":"Synthesis, structural characterization and third-order nonlinear optical properties of 1,1-diphenylmethanaminium 4-aminobenzene-sulfonate hydrate","authors":"M. Dhanalakshmi, C. Balakrishnan, M. Vijayasri, G. Vinitha, S. Parthiban","doi":"10.1007/s10854-024-13178-z","DOIUrl":null,"url":null,"abstract":"<div><p>Single crystals of 1,1-diphenylmethanaminium 4-aminobenzene-sulfonate hydrate (DPASH), were successfully synthesized. Single crystals were grown in a mixed solvent of ethanol and water (1:1) using a gradual evaporation method at room temperature. The crystal structure was determined via single-crystal X-ray diffraction analysis, revealing a monoclinic system (P2<sub>1</sub>/<i>c</i>). The vibrational bands were examined using FT-IR analysis, and the bandgap was estimated using the Kubelka–Munk algorithm. Crystal cohesion was facilitated by N⋯O, O⋯O, and π–π stacking interactions. The compound exhibits a significant third-order nonlinear optical susceptibility (<i>χ</i><sup>(3)</sup>), measured to be 2.06 × 10<sup>−6</sup> esu. This value underscores the material’s potential for applications in nonlinear optical devices. The Vickers hardness number of the DPASH crystal increased with the applied load. The characteristics of the complex, including shape, size, chemical reactivity sites, and charge density distribution, were analyzed through electron density mapping with electrostatic potential. Molecular surfaces and interactions were further examined via fingerprint plots generated from Hirshfeld surfaces. Additionally, theoretical investigations using the density functional theory method were conducted to determine polarizability and dipole moment.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13178-z","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Single crystals of 1,1-diphenylmethanaminium 4-aminobenzene-sulfonate hydrate (DPASH), were successfully synthesized. Single crystals were grown in a mixed solvent of ethanol and water (1:1) using a gradual evaporation method at room temperature. The crystal structure was determined via single-crystal X-ray diffraction analysis, revealing a monoclinic system (P21/c). The vibrational bands were examined using FT-IR analysis, and the bandgap was estimated using the Kubelka–Munk algorithm. Crystal cohesion was facilitated by N⋯O, O⋯O, and π–π stacking interactions. The compound exhibits a significant third-order nonlinear optical susceptibility (χ(3)), measured to be 2.06 × 10−6 esu. This value underscores the material’s potential for applications in nonlinear optical devices. The Vickers hardness number of the DPASH crystal increased with the applied load. The characteristics of the complex, including shape, size, chemical reactivity sites, and charge density distribution, were analyzed through electron density mapping with electrostatic potential. Molecular surfaces and interactions were further examined via fingerprint plots generated from Hirshfeld surfaces. Additionally, theoretical investigations using the density functional theory method were conducted to determine polarizability and dipole moment.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.