The Tobin Coefficient: A Relevant Photodetector Performance Metric for IR Imaging

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Olivier Gravrand, Alexandre Kerlain, Diane Sam-Giao, Maxence Soria, Johan Rothman
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引用次数: 0

Abstract

The well-known Rule07 is a simple thus efficient way to compare available technologies for IR imaging detectors in terms of dark current. The noise is then often estimated using a shot noise approximation on the dark current. Both II–VI and III–V communities use this rule of thumb as a reference for well-performing IR photodiodes. For HOT applications, a dark current close to this rule07 is considered a necessary condition but not a sufficient one to obtain a high-performance IR imager. Indeed, when limited by shot noise, rule07 describes well the noise behavior of the considered device. However, when considering low-frequency noise, it fails to describe the expected performances. In this paper, we focus on another figure-of-merit, dedicated to detector low-frequency noise rather than dark current. Systemic 1/f noise investigation in an IR detector was first reported by Tobin et al. in 1980. There is today a relative consensus on the fact that measured 1/f noise is proportional to the dark current. The ratio between the amplitude of the 1/f noise and the dark current of the same devices may therefore be used as a figure-of-merit for a given technology. This ratio (called the Tobin factor \({\alpha }_{\text{T}}\)) therefore appears adequate to compare different technologies as a figure-of-merit qualifying 1/f noise properties. This dimensionless ratio can also be very useful for optimizing a particular technology or process. However, in order to be relevant, this figure-of-merit must be estimated carefully as it appears, for instance, pixel pitch-dependent. Different examples of Tobin coefficient extraction are presented in this paper. We show that, depending on the technologies, the values of the Tobin coefficient can spread over several orders of magnitude. However, only low values result in high-quality IR imagers. Today, the best results we obtained show that \({\alpha }_{\text{T}}={10}^{-5}\) is a state-of-art value to be compared with.

Abstract Image

托宾系数:红外成像的相关光电探测器性能指标
众所周知的 Rule07 是比较现有红外成像探测器暗电流技术的一种简单而有效的方法。然后,通常使用暗电流的射频噪声近似值来估算噪声。II-VI 和 III-V 界都使用这一经验法则作为性能良好的红外光电二极管的参考。对于 HOT 应用,暗电流接近这一规则07 被认为是获得高性能红外成像器的必要条件,但并非充分条件。事实上,当受到射击噪声的限制时,规则 07 很好地描述了所考虑器件的噪声行为。然而,当考虑到低频噪声时,它却无法描述预期的性能。在本文中,我们将重点放在另一个优点上,即专门针对探测器低频噪声而非暗电流。Tobin 等人于 1980 年首次报道了红外探测器中的系统 1/f 噪声研究。如今,人们对测量到的 1/f 噪声与暗电流成正比这一事实已达成相对共识。因此,同一设备的 1/f 噪声振幅与暗电流之间的比值可用作特定技术的优劣势。因此,这一比率(称为托宾系数 \({\alpha}_{\text{T}}/))似乎足以用来比较不同技术的 1/f 噪声特性。这一无量纲比率对于优化特定技术或工艺也非常有用。不过,为了使其具有相关性,必须仔细估算这一商数,因为它似乎与像素间距有关。本文介绍了提取托宾系数的不同实例。我们发现,根据技术的不同,托宾系数的数值可以跨越几个数量级。然而,只有低值才能产生高质量的红外成像仪。如今,我们获得的最佳结果表明,{\alpha }_{\text{T}}={10}^{-5}/)是可以与之相比的最先进值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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