{"title":"Driving scheme for residual image reduction in active-matrix organic light-emitting diodes display","authors":"Zhiyong Xiong, Shuyang Yu, Qingchen Cao","doi":"10.1016/j.mejo.2024.106324","DOIUrl":null,"url":null,"abstract":"<div><p>Residual image is a frequent issue in active-matrix organic light-emitting diode (AMOLED) display, due to hysteresis effects of the internal devices. Up to now, some optimized methods have been researched mainly from process perspective. However, the approaches from driving scheme perspective and their electrical mechanism have rarely been demonstrated systematically. In this work, a technical proposal has been proposed to separate the influences of different devices including both thin film transistors (TFTs) and OLEDs furtherly. It was found that the current curve gap was nearly equal to the luminance curve gap and the main factor of residual image was shown to be the hysteresis of TFTs. An equivalent circuit of two thin film transistors and one capacitor (2T1C) was also adopted to substantiate the influences of threshold voltage (V<sub>th</sub>) compensation for reducing residual image, and a series of experiments of tuning capacitance were carried out for corresponding compensation improvements. Moreover, other driving scheme optimizations were also studied to reduce residual image furtherly, including increasing the data input time and resetting the driving TFTs. The research opens the possibility of considering reduction of residual image from driving scheme perspective and more systemic analysis from the internal electrical mechanism in AMOLED display.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124000286","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Residual image is a frequent issue in active-matrix organic light-emitting diode (AMOLED) display, due to hysteresis effects of the internal devices. Up to now, some optimized methods have been researched mainly from process perspective. However, the approaches from driving scheme perspective and their electrical mechanism have rarely been demonstrated systematically. In this work, a technical proposal has been proposed to separate the influences of different devices including both thin film transistors (TFTs) and OLEDs furtherly. It was found that the current curve gap was nearly equal to the luminance curve gap and the main factor of residual image was shown to be the hysteresis of TFTs. An equivalent circuit of two thin film transistors and one capacitor (2T1C) was also adopted to substantiate the influences of threshold voltage (Vth) compensation for reducing residual image, and a series of experiments of tuning capacitance were carried out for corresponding compensation improvements. Moreover, other driving scheme optimizations were also studied to reduce residual image furtherly, including increasing the data input time and resetting the driving TFTs. The research opens the possibility of considering reduction of residual image from driving scheme perspective and more systemic analysis from the internal electrical mechanism in AMOLED display.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.