{"title":"Electrical Strength of Polymer Film with Randomly Distributed Air Inclusions","authors":"Yu. P. Virchenko, Amanuel Mehari Tewolde","doi":"10.1134/S1027451024700332","DOIUrl":null,"url":null,"abstract":"<p>A probabilistic model has been constructed to describe the physical state of a dielectric film that contains randomly distributed air inclusions with random radius <span>\\(\\tilde {r}\\)</span>. Analysis of this model has shown that the statistical distribution of electrical strength, which is less than that of a defect-free film, has exactly two maxima. It is realized at a sufficiently low density of air inclusions of random radius <span>\\(\\tilde {r}\\)</span>, which has an almost uniform probability distribution within the limits <span>\\({{r}_{*}}\\)</span> > <span>\\(\\tilde {r}\\)</span> > 0. Moreover, the position of the first maximum is determined by the value of the parameter <span>\\({{r}_{*}}\\)</span>. With increasing defect density or film thickness, the first maximum disappears and the electrical strength distribution becomes unimodal.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 3","pages":"699 - 705"},"PeriodicalIF":0.5000,"publicationDate":"2024-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
A probabilistic model has been constructed to describe the physical state of a dielectric film that contains randomly distributed air inclusions with random radius \(\tilde {r}\). Analysis of this model has shown that the statistical distribution of electrical strength, which is less than that of a defect-free film, has exactly two maxima. It is realized at a sufficiently low density of air inclusions of random radius \(\tilde {r}\), which has an almost uniform probability distribution within the limits \({{r}_{*}}\) > \(\tilde {r}\) > 0. Moreover, the position of the first maximum is determined by the value of the parameter \({{r}_{*}}\). With increasing defect density or film thickness, the first maximum disappears and the electrical strength distribution becomes unimodal.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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