Low Dissipative State of Bi2Se3 and Bi2Te3 Surfaces

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
S. Sh. Gahramanov, Y. A. Abdullayev, H. V. Orujova, A. A. Badalov, N. A. Abdullayev
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Abstract

The morphology of the (0001) surface is studied using a scanning probe microscope, and the effect of electrolytic deposition of potassium ions on the surface properties of layered Bi2Se3 and Bi2Te3 crystals is investigated by modulation electroreflectance spectroscopy. The process of prolonged deposition of potassium atoms onto the (0001) surface of Bi2Se3 and Bi2Te3 crystals after adsorption causes their intercalation into van der Waals spaces of the quintets closest to the surface. Surface metallization with potassium and broadening of van der Waals gaps in the near-surface region during intercalation due to an increase in the barrier height lead to a weakening of interlayer interaction, a decrease in the overlap of wave functions of different layers, and a weakening of dispersion. As a result of electrodeposition, potassium intercalates into the interlayer spaces. This entails modification of the surface accompanied by an increase in the concentration of charge carriers and their mobility, which implies a transition of the near-surface region to a metallic state with lower dissipation.

Abstract Image

Abstract Image

Bi2Se3 和 Bi2Te3 表面的低耗散状态
摘要 利用扫描探针显微镜研究了(0001)表面的形貌,并通过调制电反射光谱研究了钾离子的电解沉积对层状 Bi2Se3 和 Bi2Te3 晶体表面性质的影响。钾原子吸附后在 Bi2Se3 和 Bi2Te3 晶体 (0001) 表面的长期沉积过程导致其插层进入最靠近表面的五元体的范德华空间。在插层过程中,钾的表面金属化和近表面区域范德华间隙的扩大(由于势垒高度的增加)导致层间相互作用减弱、不同层波函数的重叠减少以及色散减弱。电沉积的结果是钾插层进入层间空间。这导致表面发生变化,同时电荷载流子的浓度及其迁移率增加,这意味着近表面区域过渡到耗散较低的金属状态。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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