A new device for high-resolution Li K X-ray spectroscopy using an electron microprobe

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Pia Schweizer , Emmanuelle Brackx , Philippe Jonnard
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Abstract

Lithium is one of the key elements in today's materials and battery industry, and the interest in non-destructive characterization techniques at a micron scale for materials containing lithium is steadily increasing. The electron microprobe is a reliable and accessible analysis tool widely used for this purpose, but performing X-ray emission spectroscopy in the low-energy range is still challenging.

In this work, we demonstrate that spectroscopy in the Li K energy range is feasible by integrating a new detection system composed of a multilayer and ultra-thin separation windows into a commercial wavelength dispersive spectrometer of a microprobe. The detection system is described in detail, and the results, in form of spectra showing the Li K emission in LiF and in a ternary quasicrystalline sample, are presented and analyzed. In LiF the emission band is centered at 54.5 eV and has varying intensities for different beam exposure times. The spectra obtained in the ternary quasicrystal clearly demonstrate that the detection system has sufficient energy resolution to separate the Li emission band and the Al L2,3 and Cu M2,3 emission bands, enabling chemical state analysis by comparing the shapes of the emissions. To our knowledge, this is the first time such a detection system, implemented in a WDS spectrometer and enabling the acquisition of different Li K spectra in various compounds has been described in detail. This kind of system can be used for Li quantification using a common procedure in electron probe microanalysis.

Abstract Image

利用电子微探针进行高分辨率锂 K X 射线光谱分析的新装置
锂是当今材料和电池行业的关键元素之一,人们对含锂材料的微米级无损表征技术的兴趣正在稳步增长。在这项工作中,我们证明了在锂 K 能量范围内进行光谱分析是可行的,方法是将一个由多层和超薄分离窗组成的新型检测系统集成到微探针的商用波长色散光谱仪中。本文详细介绍了该检测系统,并以光谱形式展示和分析了锂铁和三元准晶样品中的锂钾发射结果。在 LiF 中,发射带以 54.5 eV 为中心,在不同的光束曝光时间下强度不同。在三元准晶体中获得的光谱清楚地表明,探测系统具有足够的能量分辨率,可以将锂发射带与铝 L2,3 和铜 M2,3 发射带分开,从而通过比较发射形状进行化学状态分析。据我们所知,这是首次详细描述这种在 WDS 光谱仪中实施的检测系统,它可以获取各种化合物中不同的锂 K 光谱。这种系统可用于使用电子探针显微分析中的常用程序对锂进行定量。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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