Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling

IF 3.3 Q2 ENGINEERING, MANUFACTURING
F. Uzun, Alexander M. Korsunsky
{"title":"Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling","authors":"F. Uzun, Alexander M. Korsunsky","doi":"10.3390/jmmp8040144","DOIUrl":null,"url":null,"abstract":"The utilization of the focused ion beam digital image correlation (FIB-DIC) technique for measuring in-plane displacements and the employment of the height digital image correlation (hDIC) technique as two-step DIC for determining both in-plane and out-of-plane displacements within the region of interest are detailed in this paper. Consideration is given to the microscopy data’s measurement scale and resolution to confirming the capability of both techniques to conduct micro-scale correlations with nano-scale sensitivity, thereby making it suitable for investigating the residual elastic strains formed due to processing. The sequential correlation procedure of the FIB-DIC technique has been optimized to achieve a balance between accuracy and performance for correlating sequential scanning electron microscope images. Conversely, the hDIC technique prioritizes the accurate correlation of SEM images directly with the reference state without a sequential procedure and offers optimal computational performance through advanced parallel computing tools, particularly suited for correlating profilometry data related to large-scale displacements. In this study, the algorithm of the hDIC technique is applied as two-step DIC to evaluate the elastic strain relaxation on the surface of a ring-core drilled using focused ion beam. Both techniques are utilized to correlate the same scanning electron microscope images collected during the monitoring of the ring drilling process. A comparison of the correlation results of both techniques is undertaken regarding the quantification of the near-surface residual elastic strains, with the analysis conducted to discern the superior accuracy of the hDIC algorithm. Furthermore, the distinctions between the two techniques are delineated and discussed.","PeriodicalId":16319,"journal":{"name":"Journal of Manufacturing and Materials Processing","volume":null,"pages":null},"PeriodicalIF":3.3000,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Manufacturing and Materials Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/jmmp8040144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0

Abstract

The utilization of the focused ion beam digital image correlation (FIB-DIC) technique for measuring in-plane displacements and the employment of the height digital image correlation (hDIC) technique as two-step DIC for determining both in-plane and out-of-plane displacements within the region of interest are detailed in this paper. Consideration is given to the microscopy data’s measurement scale and resolution to confirming the capability of both techniques to conduct micro-scale correlations with nano-scale sensitivity, thereby making it suitable for investigating the residual elastic strains formed due to processing. The sequential correlation procedure of the FIB-DIC technique has been optimized to achieve a balance between accuracy and performance for correlating sequential scanning electron microscope images. Conversely, the hDIC technique prioritizes the accurate correlation of SEM images directly with the reference state without a sequential procedure and offers optimal computational performance through advanced parallel computing tools, particularly suited for correlating profilometry data related to large-scale displacements. In this study, the algorithm of the hDIC technique is applied as two-step DIC to evaluate the elastic strain relaxation on the surface of a ring-core drilled using focused ion beam. Both techniques are utilized to correlate the same scanning electron microscope images collected during the monitoring of the ring drilling process. A comparison of the correlation results of both techniques is undertaken regarding the quantification of the near-surface residual elastic strains, with the analysis conducted to discern the superior accuracy of the hDIC algorithm. Furthermore, the distinctions between the two techniques are delineated and discussed.
用于评估聚焦离子束环形铣削过程中弹性应变的数字图像相关性
本文详细介绍了利用聚焦离子束数字图像相关技术(FIB-DIC)测量面内位移,以及利用高度数字图像相关技术(hDIC)作为两步 DIC,确定相关区域内的面内和面外位移。本文考虑了显微镜数据的测量尺度和分辨率,以证实这两种技术都能以纳米尺度的灵敏度进行微尺度相关分析,从而使其适用于研究加工过程中形成的残余弹性应变。FIB-DIC 技术的顺序关联程序经过优化,在关联顺序扫描电子显微镜图像的精度和性能之间实现了平衡。相反,hDIC 技术优先考虑的是扫描电子显微镜图像直接与参考状态的精确关联,而无需顺序程序,并通过先进的并行计算工具提供最佳计算性能,特别适合关联与大规模位移相关的轮廓测量数据。在本研究中,hDIC 技术的算法被应用为两步 DIC,以评估使用聚焦离子束钻孔的环芯表面的弹性应变松弛。这两种技术都用于关联在监测环形钻孔过程中收集到的相同扫描电子显微镜图像。在近表面残余弹性应变的量化方面,对两种技术的相关结果进行了比较,分析结果表明 hDIC 算法的精确度更高。此外,还对两种技术之间的区别进行了划分和讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Manufacturing and Materials Processing
Journal of Manufacturing and Materials Processing Engineering-Industrial and Manufacturing Engineering
CiteScore
5.10
自引率
6.20%
发文量
129
审稿时长
11 weeks
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