Lei Guo, Y. Ran, Xin Li, Huijun Jin, Guodong Cheng
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引用次数: 0
Abstract
Permafrost degradation varies spatially; however, the underlying mechanism remains partially unclear. In this study, we predicted permafrost variation under the influence of climate change to investigate the sensitivity of permafrost degradation to geological and climatic conditions. The results revealed that geological strata can strongly impact the permafrost degradation process. Mainly due to the greater thermal conductivity of sandy gravel in the Arctic, the complete thaw of permafrost will be greatly delayed by more than 160 years compared with that on the Qinghai–Tibet Plateau (QTP). Climatic conditions, such as snow depth, can also greatly affect the degradation process of permafrost: The thaw of permafrost will be delayed by more than 140 years when the snow depth decreases from 0.7 to 0.1 m. Peat soil thickness at ground surface can also affect permafrost degradation. The permafrost temperature increases as peat soil thickens when the thickness is less than 1.0 m, whereas there is a critical peat soil thickness (approximately 0.2 and 0.5 m on the QTP and in the Arctic, respectively) under which permafrost will thaw at the fastest rate. The findings highlight the influence of geology and climate over permafrost degradation.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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