Left ventricular assist device implantation outcomes in patients with subcutaneous implantable cardioverter-defibrillators: A case series

IF 1.3 Q3 CARDIAC & CARDIOVASCULAR SYSTEMS

American heart journal plus : cardiology research and practice Pub Date : 2024-07-17 DOI:10.1016/j.ahjo.2024.100426

Alex J. Nusbickel, Stephen Allan Petty, Steven J. Ross, Alex Parker, Juan Vilaro, Mustafa M. Ahmed

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引用次数: 0

Abstract

Background

Left ventricular assist devices (LVADs) may induce electromagnetic interference (EMI) affecting implanted cardiac devices, including more novel subcutaneous implantable cardiac defibrillators (S-ICDs).

Methods

In this case series, the authors retrospectively reviewed courses of 6 patients with S-ICDs who underwent LVAD implantation at a single center.

Results

Of the 6 patients reviewed, 4 experienced inappropriate ICD shocks, of which 3 resulted from EMI. Five of the 6 patients ultimately had S-ICD therapies disabled.

Conclusions

Due to EMI resulting in inappropriate shocks and improved tolerability of malignant arrhythmias, deactivation or removal of S-ICDs should be considered in patients undergoing LVAD implantation.

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皮下植入式心律转复除颤器患者的左心室辅助装置植入效果：病例系列

背景左心室辅助装置（LVAD）可能会诱发电磁干扰（EMI），影响植入式心脏装置，包括更新型的皮下植入式心脏除颤器（S-ICD）.方法在这一病例系列中，作者回顾性地回顾了在一个中心接受 LVAD 植入术的 6 名带有 S-ICD 的患者的病程.结果在回顾的 6 名患者中，4 人经历了不适当的 ICD 电击，其中 3 人是由 EMI 引起的.结论由于 EMI 导致不适当的电击和恶性心律失常耐受性的改善，停用或移除 S-ICD 可能会影响植入式心脏装置，包括更新型的皮下植入式心脏除颤器（S-ICD）.结论由于电磁干扰（EMI）会导致不适当的电击，而且恶性心律失常的耐受性有所提高，因此接受 LVAD 植入术的患者应考虑停用或移除 S-ICD。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

American heart journal plus : cardiology research and practice Cardiology and Cardiovascular Medicine

CiteScore

1.60

自引率

0.00%

发文量

审稿时长

59 days