{"title":"Effect of Oxygen-Related Defects on Electrical Properties of Cd0.9Zn0.1Te Semiconductor","authors":"Haiwen Yu;Hongguang Liu;Jianquan Chen;Ningbo Jia;Miao Wang;Mei Yang;Quanchao Zhang;Tao Wang;Fan Yang;Wanqi Jie","doi":"10.1109/TNS.2024.3417893","DOIUrl":null,"url":null,"abstract":"The impurity from raw material in the as-grown crystal is one of the most important factors that hamper the advancement of Cd0.9Zn0.1Te (CZT) detectors. However, the influence of impurity oxygen is rarely reported. In this study, the first principle calculation is carried out to give a prediction about transition levels of oxygen-related defects. Glow discharge mass spectrometry (GDMS) is used to determine the concentration of all the elements. The quantitative analysis of oxygen-related defects is carried out by deep-level transient spectrum (I-DLTS), which can break through the limitations of traditional C-DLTS testing in the field of high-resistance materials. The peaks observed at about 50 and 100 K are related to the level of (VCd–O\n<inline-formula> <tex-math>$_{\\mathrm {Te}})^{0/-}$ </tex-math></inline-formula>\n and (VCd–O\n<inline-formula> <tex-math>$_{\\mathrm {Te}})^{-/2-}$ </tex-math></inline-formula>\n defect pair, with energy about \n<inline-formula> <tex-math>$E_{\\mathrm {v}} +0.079$ </tex-math></inline-formula>\n eV and \n<inline-formula> <tex-math>$E_{\\mathrm {V}} +0.173$ </tex-math></inline-formula>\n eV, trap cross section about \n<inline-formula> <tex-math>$3.02\\times 10^{-19}$ </tex-math></inline-formula>\n and \n<inline-formula> <tex-math>$1.01\\times 10^{-19}$ </tex-math></inline-formula>\n cm2, respectively. The effect of oxygen on (\n<inline-formula> <tex-math>$\\mu \\tau)_{e}$ </tex-math></inline-formula>\n of the CZT semiconductors is evaluated through Alpha particle spectrum response testing by fitting the charge collection efficiency with applied bias voltages. The (\n<inline-formula> <tex-math>$\\mu \\tau)_{e}$ </tex-math></inline-formula>\n is about \n<inline-formula> <tex-math>$5.21\\times 10^{-4}$ </tex-math></inline-formula>\n cm2/V in CZT with more oxygen and \n<inline-formula> <tex-math>$2.33\\times 10^{-3}$ </tex-math></inline-formula>\n cm2/V with less oxygen. The mobility is obtained from the results of the time of flight (TOF) testing through the laser-beam-induced current (LBIC) technique, to be around 1000 cm2/V\n<inline-formula> <tex-math>$\\cdot $ </tex-math></inline-formula>\ns1 for both samples, and the lifetime to be 494 and 2407 ns, respectively. It can be concluded that oxygen-related defects can terribly affect the electron transport properties.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"71 8","pages":"1996-2002"},"PeriodicalIF":1.9000,"publicationDate":"2024-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nuclear Science","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10596306/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The impurity from raw material in the as-grown crystal is one of the most important factors that hamper the advancement of Cd0.9Zn0.1Te (CZT) detectors. However, the influence of impurity oxygen is rarely reported. In this study, the first principle calculation is carried out to give a prediction about transition levels of oxygen-related defects. Glow discharge mass spectrometry (GDMS) is used to determine the concentration of all the elements. The quantitative analysis of oxygen-related defects is carried out by deep-level transient spectrum (I-DLTS), which can break through the limitations of traditional C-DLTS testing in the field of high-resistance materials. The peaks observed at about 50 and 100 K are related to the level of (VCd–O
$_{\mathrm {Te}})^{0/-}$
and (VCd–O
$_{\mathrm {Te}})^{-/2-}$
defect pair, with energy about
$E_{\mathrm {v}} +0.079$
eV and
$E_{\mathrm {V}} +0.173$
eV, trap cross section about
$3.02\times 10^{-19}$
and
$1.01\times 10^{-19}$
cm2, respectively. The effect of oxygen on (
$\mu \tau)_{e}$
of the CZT semiconductors is evaluated through Alpha particle spectrum response testing by fitting the charge collection efficiency with applied bias voltages. The (
$\mu \tau)_{e}$
is about
$5.21\times 10^{-4}$
cm2/V in CZT with more oxygen and
$2.33\times 10^{-3}$
cm2/V with less oxygen. The mobility is obtained from the results of the time of flight (TOF) testing through the laser-beam-induced current (LBIC) technique, to be around 1000 cm2/V
$\cdot $
s1 for both samples, and the lifetime to be 494 and 2407 ns, respectively. It can be concluded that oxygen-related defects can terribly affect the electron transport properties.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.