Matching constraint extraction for analog integrated circuits layout via edge classify

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Ran Ran Wu, Yong Zhang, Zhen Hua He, Bo Wen Jia, Ning Xu
{"title":"Matching constraint extraction for analog integrated circuits layout via edge classify","authors":"Ran Ran Wu,&nbsp;Yong Zhang,&nbsp;Zhen Hua He,&nbsp;Bo Wen Jia,&nbsp;Ning Xu","doi":"10.1016/j.vlsi.2024.102239","DOIUrl":null,"url":null,"abstract":"<div><p>Achieving matching constraints between various components is important in analog integrated circuit (IC) layout design, as it can reduce the impact of layout parasitics on the performance of IC. When automating analog integrated circuit layout design, identifying accurate matching constraints is an essential step before placement and routing. The matching relationship between devices strongly depends on circuit's topology and design expertise. This work focuses on differential circuits with various topologies and proposes a supervised learning framework that incorporates symmetry analysis. The heterogeneous multi-relationship graph representation is proposed to capture circuit's topology and extract matching constraints. Additionally, a symmetry analysis algorithm and filtering method based on matching levels are investigated to enhance the model's performance. The experimental results demonstrate that this work maintains a low false alarm rate and outperforms other matching constraint detection algorithms in terms of F<sub>1</sub> score and accuracy.</p></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926024001032","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

Abstract

Achieving matching constraints between various components is important in analog integrated circuit (IC) layout design, as it can reduce the impact of layout parasitics on the performance of IC. When automating analog integrated circuit layout design, identifying accurate matching constraints is an essential step before placement and routing. The matching relationship between devices strongly depends on circuit's topology and design expertise. This work focuses on differential circuits with various topologies and proposes a supervised learning framework that incorporates symmetry analysis. The heterogeneous multi-relationship graph representation is proposed to capture circuit's topology and extract matching constraints. Additionally, a symmetry analysis algorithm and filtering method based on matching levels are investigated to enhance the model's performance. The experimental results demonstrate that this work maintains a low false alarm rate and outperforms other matching constraint detection algorithms in terms of F1 score and accuracy.

通过边缘分类提取模拟集成电路布局的匹配约束条件
在模拟集成电路(IC)布局设计中,实现各种元件之间的匹配约束非常重要,因为它可以减少布局寄生效应对集成电路性能的影响。在实现模拟集成电路布局设计自动化时,确定准确的匹配约束条件是布局和布线前的重要步骤。器件之间的匹配关系在很大程度上取决于电路的拓扑结构和设计专长。这项工作重点关注具有各种拓扑结构的差分电路,并提出了一个包含对称性分析的监督学习框架。提出了异构多关系图表示法来捕捉电路拓扑并提取匹配约束。此外,还研究了一种对称性分析算法和基于匹配水平的过滤方法,以提高模型的性能。实验结果表明,这项工作保持了较低的误报率,在 F1 分数和准确性方面优于其他匹配约束检测算法。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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