Radiation Hardness of Modern Photogate Pixels Under Total Ionizing Dose: Impact of Pixel Pitch and Electron or Hole Collection

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Nuclear Science Pub Date : 2024-07-10 DOI:10.1109/TNS.2024.3426077

Victor Malherbe;Olivier Nier;Soilihi Moindjie;Philippe Roche;François Roy;Arnaud Tournier

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引用次数: 0

Abstract

Gamma and X-ray irradiation results are reported on several variants of deep-trench photogate research and development pixels from STMicroelectronics. Dark current performances are compared for electron and hole-collecting pixels (n, p-type) of 2 and

$1~{\mu }$

m pitch. Total ionizing dose (TID) results on

$2~{\mu }$

m p-type photogates are generally consistent with previous studies, showing state-of-the-art radiation tolerance at 70 kGy (Si);

$1~{\mu }$

m n-type pixels are found to quickly degrade under radiation, in line with expectations;

$1~{\mu }$

m p-type photogates exhibit very promising radiation hardness, improving on the

$2~{\mu }$

m p-type results by more than two orders of magnitude, with a dark current below 50 h+/s after 40 kGy gamma rays or 64 kGy (Si) X-rays.

查看原文本刊更多论文

现代光栅像素在总电离剂量下的辐射硬度：像素间距和电子或空穴收集的影响

报告了意法半导体公司深沟光栅研发像素的几种变体的伽马射线和 X 射线辐照结果。比较了间距为 2 和 1~{\mu }$ m 的电子和空穴收集像素（n 型、p 型）的暗电流性能。2~{\mu }$ m p 型光电元件的总电离剂量 (TID) 结果与之前的研究基本一致，显示出 70 kGy（硅）的最先进辐射耐受性；1~{\mu }$ m n 型像素在辐射下会迅速衰减，符合预期； 1~{\mu }$ m p 型光栅表现出非常好的辐射硬度，比 2~{\mu }$ m p 型的结果提高了两个数量级以上，在 40 kGy 伽马射线或 64 kGy（硅）X 射线之后，暗电流低于 50 h+/s。

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来源期刊

IEEE Transactions on Nuclear Science 工程技术-工程：电子与电气

CiteScore

3.70

自引率

27.80%

发文量

314

审稿时长

6.2 months

期刊介绍： The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years. The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.