{"title":"Efficient Error Detection Cryptographic Architectures Benchmarked on FPGAs for Montgomery Ladder","authors":"Kasra Ahmadi;Saeed Aghapour;Mehran Mozaffari Kermani;Reza Azarderakhsh","doi":"10.1109/TVLSI.2024.3419700","DOIUrl":null,"url":null,"abstract":"Elliptic curve scalar multiplication (ECSM) is a fundamental element of public key cryptography. The ECSM implementations on deeply embedded architectures and Internet-of-nano-Things have been vulnerable to both permanent and transient errors, as well as fault attacks. Consequently, error detection is crucial. In this work, we present a novel algorithm-level error detection scheme on Montgomery Ladder often used for a number of elliptic curves featuring highly efficient point arithmetic, known as Montgomery curves. Our error detection simulations achieve high error coverage on loop abort and scalar bit flipping fault model using binary tree data structure. Assuming n is the size of the private key, the overhead of our error detection scheme is \n<inline-formula> <tex-math>$O(n)$ </tex-math></inline-formula>\n. Finally, we conduct a benchmark of our proposed error detection scheme on both ARMv8 and field-programmable gate array (FPGA) platforms to illustrate the implementation and resource utilization. Deployed on Cortex-A72 processors, our proposed error detection scheme maintains a clock cycle overhead of less than 5.2%. In addition, integrating our error detection approach into FPGAs, including AMD/Xilinx Zynq Ultrascale+ and Artix Ultrascale+, results in a comparable throughput and less than 2% increase in area compared with the original hardware implementation. We note that we envision using adoptions of the proposed architectures in the postquantum cryptography (PQC) based on elliptic curves.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10587011/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Elliptic curve scalar multiplication (ECSM) is a fundamental element of public key cryptography. The ECSM implementations on deeply embedded architectures and Internet-of-nano-Things have been vulnerable to both permanent and transient errors, as well as fault attacks. Consequently, error detection is crucial. In this work, we present a novel algorithm-level error detection scheme on Montgomery Ladder often used for a number of elliptic curves featuring highly efficient point arithmetic, known as Montgomery curves. Our error detection simulations achieve high error coverage on loop abort and scalar bit flipping fault model using binary tree data structure. Assuming n is the size of the private key, the overhead of our error detection scheme is
$O(n)$
. Finally, we conduct a benchmark of our proposed error detection scheme on both ARMv8 and field-programmable gate array (FPGA) platforms to illustrate the implementation and resource utilization. Deployed on Cortex-A72 processors, our proposed error detection scheme maintains a clock cycle overhead of less than 5.2%. In addition, integrating our error detection approach into FPGAs, including AMD/Xilinx Zynq Ultrascale+ and Artix Ultrascale+, results in a comparable throughput and less than 2% increase in area compared with the original hardware implementation. We note that we envision using adoptions of the proposed architectures in the postquantum cryptography (PQC) based on elliptic curves.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.