{"title":"Dual model knowledge distillation for industrial anomaly detection","authors":"Simon Thomine, Hichem Snoussi","doi":"10.1007/s10044-024-01295-8","DOIUrl":null,"url":null,"abstract":"<p>Unsupervised anomaly detection holds significant importance in large-scale industrial manufacturing. Recent methods have capitalized on the benefits of employing a classifier pretrained on natural images to extract representative features from specific layers, which are subsequently processed using various techniques. Notably, memory bank-based methods, which have demonstrated exceptional accuracy, often incur a trade-off in terms of latency, posing a challenge in real-time industrial applications where prompt anomaly detection and response are crucial. Indeed, alternative approaches such as knowledge distillation and normalized flow have demonstrated promising performance in unsupervised anomaly detection while maintaining low latency. In this paper, we aim to revisit the concept of knowledge distillation in the context of unsupervised anomaly detection, emphasizing the significance of feature selection. By employing distinctive features and leveraging different models, we intend to highlight the importance of carefully selecting and utilizing relevant features specifically tailored for the task of anomaly detection. This article presents a novel approach for anomaly detection, which employs dual model knowledge distillation and incorporates various types of semantic information by leveraging high and low-level semantic information.</p>","PeriodicalId":54639,"journal":{"name":"Pattern Analysis and Applications","volume":"183 1","pages":""},"PeriodicalIF":3.7000,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pattern Analysis and Applications","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1007/s10044-024-01295-8","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Unsupervised anomaly detection holds significant importance in large-scale industrial manufacturing. Recent methods have capitalized on the benefits of employing a classifier pretrained on natural images to extract representative features from specific layers, which are subsequently processed using various techniques. Notably, memory bank-based methods, which have demonstrated exceptional accuracy, often incur a trade-off in terms of latency, posing a challenge in real-time industrial applications where prompt anomaly detection and response are crucial. Indeed, alternative approaches such as knowledge distillation and normalized flow have demonstrated promising performance in unsupervised anomaly detection while maintaining low latency. In this paper, we aim to revisit the concept of knowledge distillation in the context of unsupervised anomaly detection, emphasizing the significance of feature selection. By employing distinctive features and leveraging different models, we intend to highlight the importance of carefully selecting and utilizing relevant features specifically tailored for the task of anomaly detection. This article presents a novel approach for anomaly detection, which employs dual model knowledge distillation and incorporates various types of semantic information by leveraging high and low-level semantic information.
期刊介绍:
The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.