Fusheng Li , Zhigang Wang , Xixue Liu , Lei Xu , Fuwen Zhang , Huijun He
{"title":"A contrastive analysis of Sb distribution in Sn-Bi-Sb solder by WDS and EDS","authors":"Fusheng Li , Zhigang Wang , Xixue Liu , Lei Xu , Fuwen Zhang , Huijun He","doi":"10.1016/j.matlet.2024.136922","DOIUrl":null,"url":null,"abstract":"<div><p>This work provides a contrastive analysis of Sb distribution in Sn-57Bi-1Sb solder by WDS mapping, EDS count map and EDS net map. The mapping analysis on the same region shows that the WDS mapping provides the more accurate data on the distribution of Sb compared with EDS analysis, including the concentration gradient of dissolved Sb and the fine SnSb particles with size less than 1 μm. WDS equipped with the enhanced spectral resolution is a critical technique to separate the complex overlap spectrum, which was recommended for the Sb detection in Sb-doped solders.</p></div>","PeriodicalId":384,"journal":{"name":"Materials Letters","volume":null,"pages":null},"PeriodicalIF":2.7000,"publicationDate":"2024-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Letters","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167577X24010619","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
This work provides a contrastive analysis of Sb distribution in Sn-57Bi-1Sb solder by WDS mapping, EDS count map and EDS net map. The mapping analysis on the same region shows that the WDS mapping provides the more accurate data on the distribution of Sb compared with EDS analysis, including the concentration gradient of dissolved Sb and the fine SnSb particles with size less than 1 μm. WDS equipped with the enhanced spectral resolution is a critical technique to separate the complex overlap spectrum, which was recommended for the Sb detection in Sb-doped solders.
期刊介绍:
Materials Letters has an open access mirror journal Materials Letters: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
Materials Letters is dedicated to publishing novel, cutting edge reports of broad interest to the materials community. The journal provides a forum for materials scientists and engineers, physicists, and chemists to rapidly communicate on the most important topics in the field of materials.
Contributions include, but are not limited to, a variety of topics such as:
• Materials - Metals and alloys, amorphous solids, ceramics, composites, polymers, semiconductors
• Applications - Structural, opto-electronic, magnetic, medical, MEMS, sensors, smart
• Characterization - Analytical, microscopy, scanning probes, nanoscopic, optical, electrical, magnetic, acoustic, spectroscopic, diffraction
• Novel Materials - Micro and nanostructures (nanowires, nanotubes, nanoparticles), nanocomposites, thin films, superlattices, quantum dots.
• Processing - Crystal growth, thin film processing, sol-gel processing, mechanical processing, assembly, nanocrystalline processing.
• Properties - Mechanical, magnetic, optical, electrical, ferroelectric, thermal, interfacial, transport, thermodynamic
• Synthesis - Quenching, solid state, solidification, solution synthesis, vapor deposition, high pressure, explosive