Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Francesca Falcone , Amedeo Cinosi , Giacomo Siviero , Gianluigi Rosatelli
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引用次数: 0

Abstract

Material science is an interdisciplinary field that draws on elements of chemistry, physics, engineering and deals with designing, producing, and using a wide range of materials. The methodological approach of materials investigation is very significant in cultural heritage.

The study of Cultural Heritage materials is useful for dating, unraveling production technologies, sources and trading, and their restoration and preservation.

Archaeometry is the tool for material characterization, but it cannot always be applied in a non-destructive way: as a result, analytical techniques requiring minimum sampling are of great interest. For this, Total reflection X-ray fluorescence (TXRF) spectrometry is an effective technique, thanks to its microanalytical capabilities and the possibility of preserving the sample after its analysis, either for additional investigations or archiving purposes. It is very sensitive to period four transition elements but less effective with lighter ones. Thus, to gather the most comprehensive analysis of historic enamelled ceramics, Scanning Electron Microscopy-Energy Dispersive Spectroscopy (SEM-EDS) and TXRF spectrometry were combined in a novel analytical approach.

Soil standards and natural soil pigment samples were tested to validate the novel analytical approach. Na, Mg, Al, Si, K and Ca were determined with SEM-EDS analysis and used for TXRF quantification of heavier elements without adding any internal standard. The methodology to determine the total composition of artifacts, by integrating the concentrations of light elements in EDS with the data of the heavier elements obtained with TXRF, is here developed expressing elements as oxides recalculated to 100%. Recovery values for standards were found mostly within 20% of the certified values for MgO, Al2O3, SiO2, K2O, TiO2, Cr2O3, MnO, Fe2O3, NiO, CuO, PbO and SrO. The detection capabilities for major, minor and trace elements in soil pigments prove that this novel, practically non-destructive, analytical approach has a high potential for obtaining the elemental composition of Cultural Heritage materials with broad applications.

Abstract Image

集成 SEM-EDS 和 TXRF 显微分析用于材料科学表征的创新方法:文化遗产研究的视角
材料科学是一个跨学科领域,它吸收了化学、物理学和工程学的元素,涉及各种材料的设计、生产和使用。对文化遗产材料的研究有助于确定其年代,揭示其生产技术、来源和贸易,以及对其进行修复和保护。考古学是材料特征描述的工具,但它并不能总是以非破坏性的方式应用:因此,需要最少取样的分析技术非常有意义。在这方面,全反射 X 射线荧光 (TXRF) 光谱法是一种有效的技术,因为它具有微观分析能力,并且可以在分析后保存样品,以便进行其他调查或存档。它对四周期过渡元素非常敏感,但对轻元素则不太有效。因此,为了对历史珐琅彩陶瓷进行最全面的分析,我们将扫描电子显微镜-能量色散光谱法(SEM-EDS)和 TXRF 光谱法结合起来,采用一种新型分析方法。通过 SEM-EDS 分析测定了 Na、Mg、Al、Si、K 和 Ca,并在不添加任何内标物的情况下用于 TXRF 对较重元素的定量。通过将 EDS 中的轻元素浓度与 TXRF 获得的重元素数据进行整合,确定人工制品总成分的方法在此得到了发展,将元素表示为氧化物,重新计算为 100%。发现氧化镁、氧化铝、二氧化硅、氧化钾、二氧化钛、氧化铬、氧化锰、氧化铁、氧化镍、氧化铜、氧化铅和氧化锶的标准回收值大多在认证值的 20% 以内。对土壤色素中主要、次要和微量元素的检测能力证明,这种新颖、实际无损的分析方法在获取文化遗产材料的元素组成方面具有很大的潜力,应用范围很广。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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