{"title":"A Framework for the Generation of Monitor and Plant Model From Event Logs Using Process Mining for Formal Verification of Event-Driven Systems","authors":"Midhun Xavier;Victor Dubinin;Sandeep Patil;Valeriy Vyatkin","doi":"10.1109/OJIES.2024.3406059","DOIUrl":null,"url":null,"abstract":"This article proposes a method for the automatic generation of a plant model and monitoring using process mining algorithms based on recorded event logs. The behavioral traces of the system are captured by recording event logs during plant operation in either manual control mode or with an automatic controller. Process discovery algorithms are then applied to extract the logic of the process behavior properties from the recorded event logs. The result is represented as a Petri net, which is used to construct the state machine of the plant model and monitor and is in accordance with the IEC 61499 Standard. The monitor is implemented as a function block and can be deployed in real time to trigger an error signal whenever there is a deviation from the actual process scenario. The plant model and controller are connected in a closed loop and are used for the formal verification of the system with the help of the “fb2smv” converter and symbolic model checking tool NuSMV.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"517-534"},"PeriodicalIF":5.2000,"publicationDate":"2024-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10550182","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of the Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10550182/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article proposes a method for the automatic generation of a plant model and monitoring using process mining algorithms based on recorded event logs. The behavioral traces of the system are captured by recording event logs during plant operation in either manual control mode or with an automatic controller. Process discovery algorithms are then applied to extract the logic of the process behavior properties from the recorded event logs. The result is represented as a Petri net, which is used to construct the state machine of the plant model and monitor and is in accordance with the IEC 61499 Standard. The monitor is implemented as a function block and can be deployed in real time to trigger an error signal whenever there is a deviation from the actual process scenario. The plant model and controller are connected in a closed loop and are used for the formal verification of the system with the help of the “fb2smv” converter and symbolic model checking tool NuSMV.
期刊介绍:
The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments.
Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.