M. Lapenna, A. Tsamos, F. Faglioni, R. Fioresi, F. Zanchetta, G. Bruno
{"title":"Geometric deep learning for enhanced quantitative analysis of microstructures in X-ray computed tomography data","authors":"M. Lapenna, A. Tsamos, F. Faglioni, R. Fioresi, F. Zanchetta, G. Bruno","doi":"10.1007/s42452-024-05985-0","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517252,"journal":{"name":"Discover Applied Sciences","volume":" 5","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Discover Applied Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s42452-024-05985-0","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}