Adaptive block imaging based on compressive sensing in AFM

IF 2 3区 工程技术 Q2 ANATOMY & MORPHOLOGY
Yuchuan Zhang, Yongjian Chen, Teng Wu, Guoqiang Han
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引用次数: 0

Abstract

Atomic force microscopy (AFM) is a kind of high-precision instrument to measure the surface morphology of various conductive or nonconductive samples. However, obtaining a high-resolution image with standard AFM scanning requires more time. Using block compressive sensing (BCS) is an effective approach to achieve rapid AFM imaging. But, the routine BCS-AFM imaging is difficult to balance the image quality of each local area. It is easy to lead to excessive sampling in some flat areas, resulting in time-consuming. At the same time, there is a lack of sampling in some areas with significant details, resulting in poor imaging quality. Thus, an innovative adaptive BCS-AFM imaging method is proposed. The overlapped block is used to eliminate blocking artifacts. Characteristic parameters (GTV, Lu, and SD) are used to predict the local morphological characteristics of the samples. Back propagation neural network is employed to acquire the appropriate sampling rate of each sub-block. Sampling points are obtained by pre-scanning and adaptive supplementary scanning. Afterward, all sub-block images are reconstructed using the TVAL3 algorithm. Each sample is capable of achieving uniform, excellent image quality. Image visual effects and evaluation indicators (PSNR and SSIM) are employed for the purpose of evaluating and analyzing the imaging effects of samples. Compared with two nonadaptive and two other adaptive imaging schemes, our proposed scheme has the characteristics of a high degree of automation, uniformly high-quality imaging, and rapid imaging speed.

Highlights

  • The proposed adaptive BCS method can address the issues of uneven image quality and slow imaging speed in AFM.
  • The appropriate sampling rate of each sub-block of the sample can be obtained by BP neural network.
  • The introduction of GTV, Lu, and SD can effectively reveal the morphological features of AFM images.
  • Seven samples with different morphology are used to test the performance of the proposed adaptive algorithm.
  • Practical experiments are carried out with two samples to verify the feasibility of the proposed adaptive algorithm.
基于压缩传感的原子力显微镜自适应块成像。
原子力显微镜(AFM)是一种测量各种导电或不导电样品表面形态的高精度仪器。然而,使用标准 AFM 扫描获得高分辨率图像需要较长的时间。使用块压缩传感(BCS)是实现快速原子力显微镜成像的有效方法。但是,常规的 BCS-AFM 成像很难平衡每个局部区域的图像质量。它容易导致在一些平坦区域过度采样,从而造成耗时。同时,在一些细节明显的区域采样不足,导致成像质量不佳。因此,我们提出了一种创新的自适应 BCS-AFM 成像方法。重叠区块用于消除阻塞伪影。特征参数(GTV、Lu 和 SD)用于预测样本的局部形态特征。采用反向传播神经网络获取每个子块的适当采样率。采样点通过预扫描和自适应补充扫描获得。然后,使用 TVAL3 算法重建所有子块图像。每个样本都能获得均匀、出色的图像质量。图像视觉效果和评价指标(PSNR 和 SSIM)用于评估和分析样本的成像效果。与两种非自适应成像方案和另外两种自适应成像方案相比,我们提出的方案具有自动化程度高、成像质量均匀、成像速度快等特点。亮点:所提出的自适应 BCS 方法可解决原子力显微镜成像质量不均匀和成像速度慢的问题。通过 BP 神经网络可获得样本每个子块的合适采样率。引入 GTV、Lu 和 SD 可以有效揭示原子力显微镜图像的形态特征。我们使用了七个不同形态的样本来测试所提出的自适应算法的性能。利用两个样本进行了实际实验,验证了所提自适应算法的可行性。
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来源期刊
Microscopy Research and Technique
Microscopy Research and Technique 医学-解剖学与形态学
CiteScore
5.30
自引率
20.00%
发文量
233
审稿时长
4.7 months
期刊介绍: Microscopy Research and Technique (MRT) publishes articles on all aspects of advanced microscopy original architecture and methodologies with applications in the biological, clinical, chemical, and materials sciences. Original basic and applied research as well as technical papers dealing with the various subsets of microscopy are encouraged. MRT is the right form for those developing new microscopy methods or using the microscope to answer key questions in basic and applied research.
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